Non-Destructive Steady-State and Time-Resolved Photoluminescence (TRPL) Characterization of Photovoltaic Devices

When and Where

Nov 28, 2023
8:00pm - 10:00pm

Hynes, Level 1, Hall A

Presenter

Christian Oelsner

Volker Buschmann

Eugeny Ermilov

Bita Rezania

Felix Koberling

Rainer Erdmann

Co-Author(s)

Christian Oelsner¹,Volker Buschmann¹,Eugeny Ermilov¹,Bita Rezania¹,Felix Koberling¹,Rainer Erdmann¹

PicoQuant GmbH¹

Abstract

Christian Oelsner¹,Volker Buschmann¹,Eugeny Ermilov¹,Bita Rezania¹,Felix Koberling¹,Rainer Erdmann¹

PicoQuant GmbH¹

Over years, (time-resolved) photoluminescence spectroscopy (TR)PL has been established as one of the fundamental methods for analyzing the photophysical properties of a wide variety of samples, ranging from organic molecules to semiconductor materials and photovoltaic (PV) devices. The combination of luminescence spectral and lifetime information provides a better understanding of photophysical processes and their dynamics in PV materials. This understanding can be further enhanced by including spatial information.<br/><br/>Herein, we will demonstrate that the combination of time-resolved laser scanning microscopy and PL spectroscopy provides a powerful characterization tool. This combination allows mapping of a broad range of phenomena including TRPL, carrier diffusion, SHG/2PE, wavelength and power dependent emission with high spatial resolution, for various sample geometries e.g., thin films. Therefore, one can infer structural-to-photophysical relationships in new classes of PV materials which ultimately leads to the optimization of the PV device performance.