MRS Meetings and Events

 

MD02.07.16 2023 MRS Spring Meeting

Machine-Learning Interatomic Potential for Silicon Carbide: A Molecular Dynamics Study of Mechanical Properties

When and Where

Apr 13, 2023
5:00pm - 7:00pm

Moscone West, Level 1, Exhibit Hall

Presenter

Co-Author(s)

Kenji Nishimura1,Ken-ichi Saitoh2

National Institute of Advanced Industrial Science and Technology1,Kansai University2

Abstract

Kenji Nishimura1,Ken-ichi Saitoh2

National Institute of Advanced Industrial Science and Technology1,Kansai University2
Silicon carbide (SiC) is a promising candidate for next-generation power electronics materials because of its superior electrical properties. However, SiC is a brittle material at low temperatures and is known to be a hard-to-work material. Thus, ductile mode machining, which yields a highly efficient and smooth machined surface, has been developed over several decades. To grind brittle materials in ductile mode, a basic understanding of the material’s mechanical properties is necessary, that is, mechanisms of plastic deformation, phase transformation, and crystal defect formation. Specifically, since electronic materials require precise processing, mechanical phenomena occurring at the nanoscale should be focused on.<br/> Quantum electronic structure calculations are highly accurate, but due to its high calculation cost, the computational scale is often limited to hundreds of atoms. That is why it is difficult to elucidate the mechanical properties including nanoscale phenomena at an atomistic point of view by means of first-principles calculations. Recently, some types of machine-learning interatomic potentials (ML-IAPs) have been proposed, which can reproduce the results of the first-principles calculations adequately without any empirical information or data, and have been applied to molecular dynamics (MD) simulations. It is expected for ML-IAPs to analyze crystalline defects in large systems with the same accuracy as the first-principles calculations.<br/> In this study, we attempt to create a spectral neighbor analysis potential (SNAP) for SiC from reference data obtained by the first-principles calculations. The SNAP proposed by Thompson et al as one of ML-IAPs adopts bispectrum components as descriptors to express the energy of the atomic system. Then the SNAP potential for SiC we built is applied to MD simulations to examine its reproducibility. As a result, the SNAP potential developed in this study reproduces a lattice constant, elastic modulus, and bulk modulus with higher accuracy than any other empirical ones. We confirm that stable edge dislocation cores are generated as a dislocation dipole in crystalline 3C-SiC and they properly glide in a predicted slip plane. Additionally, the Peierls stress estimated by our MD simulations agrees well with that of the previous study.

Keywords

ductility

Symposium Organizers

Soumendu Bagchi, Los Alamos National Laboratory
Huck Beng Chew, The University of Illinois at Urbana-Champaign
Haoran Wang, Utah State University
Jiaxin Zhang, Oak Ridge National Laboratory

Symposium Support

Bronze
Patterns and Matter, Cell Press

Session Chairs

Soumendu Bagchi
Haoran Wang

In this Session

MD02.07.01
Automated Defect Analysis of CdSe Nanoparticles through Supervised Learning with Large Simulated Databases

MD02.07.02
STEM Image Analysis Based on Deep Learning—Identification of Vacancy of Defects and Polymorphs of MoS2

MD02.07.03
Beyond Single Molecules: Intermolecular Interference Effects

MD02.07.04
Insight into the Reactivity of Electrocatalytic Glycerol Oxidation—The Strength of the Hydroxyl Group Bonding on Surface

MD02.07.05
Ripplocation Boundaries and Kink Boundaries in Layered Solids

MD02.07.06
Data-Driven Electrode Optimization for Vanadium Redox Flow Battery by Reduced Order Model

MD02.07.07
Application of Baysian Super Resolution to Spectroscopic Data Analysis

MD02.07.08
A Workflow to Track Time-Resolved Dislocation Behavior in High Temperature Aluminum

MD02.07.09
Investigation of Solidification in Supercooled Water Drops using Large Data Sets of Synchronized Optical Images and X-ray Diffraction Patterns

MD02.07.10
Characterizing Dislocations by formulating the Invisibility Criterion for DFXM

View More »

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