MRS Meetings and Events

 

MD02.07.07 2023 MRS Spring Meeting

Application of Baysian Super Resolution to Spectroscopic Data Analysis

When and Where

Apr 13, 2023
5:00pm - 7:00pm

Moscone West, Level 1, Exhibit Hall

Presenter

Co-Author(s)

Shunta Harada1,Kota Tsujimori1,Jun Hirotani2

Nagoya Univ1,Kyoto University2

Abstract

Shunta Harada1,Kota Tsujimori1,Jun Hirotani2

Nagoya Univ1,Kyoto University2
The number of data points of digitally recorded spectra have been limited by the number of multi-channel detectors employed, which sometimes inhibits the precise characterization of spectral peak shape. Here we describe a methodology to increase the number of data points as well as the signal-to-noise (S/N) ratio by applying Bayesian super-resolution in the analysis of spectroscopic data. In our present method, first the hyperparameters for the Bayesian super-resolution are determined by a virtual experiment imitating actual experimental data, and the precision of the super-resolution reconstruction is confirmed by the calculation of errors from the ideal values. For validation of the super-resolution reconstruction of spectroscopic data, we applied this method to the analysis of Raman spectra. From 200 Raman spectra of a reference Si substrate with a data interval of about 0.8 cm<sup>-1</sup>, superresolution reconstruction with a data interval of 0.01 cm<sup>-1</sup> was successfully achieved with the promised precision. From the super-resolution spectrum, the Raman scattering peak of the reference Si substrate was estimated as 520.55 (+0.12, -0.09) cm<sup>-1</sup>, which is comparable to the precisely determined value reported in previous works. The present methodology can be applied to various kinds of spectroscopic analysis, leading to increased precision in the analysis of spectroscopic data and the ability to detect slight differences in spectral peak positions and shapes. So far, we have already confirmed that the present method is effective not only to Raman spectroscopy but also to electron energy loss spectroscopy (EELS), X-ray photoelectron spectroscopy and the electric signals.

Keywords

electron energy loss spectroscopy (EELS) | metrology | Raman spectroscopy

Symposium Organizers

Soumendu Bagchi, Los Alamos National Laboratory
Huck Beng Chew, The University of Illinois at Urbana-Champaign
Haoran Wang, Utah State University
Jiaxin Zhang, Oak Ridge National Laboratory

Symposium Support

Bronze
Patterns and Matter, Cell Press

Session Chairs

Soumendu Bagchi
Haoran Wang

In this Session

MD02.07.01
Automated Defect Analysis of CdSe Nanoparticles through Supervised Learning with Large Simulated Databases

MD02.07.02
STEM Image Analysis Based on Deep Learning—Identification of Vacancy of Defects and Polymorphs of MoS2

MD02.07.03
Beyond Single Molecules: Intermolecular Interference Effects

MD02.07.04
Insight into the Reactivity of Electrocatalytic Glycerol Oxidation—The Strength of the Hydroxyl Group Bonding on Surface

MD02.07.05
Ripplocation Boundaries and Kink Boundaries in Layered Solids

MD02.07.06
Data-Driven Electrode Optimization for Vanadium Redox Flow Battery by Reduced Order Model

MD02.07.07
Application of Baysian Super Resolution to Spectroscopic Data Analysis

MD02.07.08
A Workflow to Track Time-Resolved Dislocation Behavior in High Temperature Aluminum

MD02.07.09
Investigation of Solidification in Supercooled Water Drops using Large Data Sets of Synchronized Optical Images and X-ray Diffraction Patterns

MD02.07.10
Characterizing Dislocations by formulating the Invisibility Criterion for DFXM

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Publishing Alliance

MRS publishes with Springer Nature