MRS Meetings and Events

 

NM01.28.10 2022 MRS Spring Meeting

High-Temperature Robustness Exhibited by h-BN Based Deep Ultraviolet Photodetectors

When and Where

May 23, 2022
8:25pm - 8:30pm

NM01-Virtual

Presenter

Co-Author(s)

Shuchi Kaushik1,Sahin Sorifi1,Rajendra Singh1

Indian Institute of Technology Delhi1

Abstract

Shuchi Kaushik1,Sahin Sorifi1,Rajendra Singh1

Indian Institute of Technology Delhi1
Two-dimensional layered materials (2DLMs) have revolutionized the field of optoelectronics due to their appealing properties of strong-light matter interaction, atomic-level thickness, and ability to form van der Waals heterostructures.<sup>[1]</sup> However, most of the 2DLMs possess a narrow bandgap and are, therefore, suitable for visible or infra-red photodetection. In addition, the poor stability of some of the 2DLMs is a matter of concern as far as practical applications are concerned.<sup>[2]</sup> Owing to its wide bandgap of 5.955 eV<sup>[3]</sup> and high-temperature stability,<sup>[4]</sup> hexagonal-boron nitride (h-BN) has emerged as an ideal 2DLM for fabricating deep UV photodetectors (PDs) that may find a place in commercial applications requiring high-temperature robustness.<sup>[5]</sup><br/>In this work, we explore the high-temperature stability of metal-semiconductor-metal (MSM) deep UV PDs fabricated on high-quality mechanically exfoliated h-BN flakes. The MSM structure of the device is fabricated on individual flakes using electron beam lithography. High work function metal platinum (Pt) is deposited using sputtering to obtain Pt/h-BN/Pt MSM PDs. The device exhibits an ultra-low dark current of 1.96 × 10<sup>-14</sup> A at 10 V. Upon shining the deep UV wavelength of 205 nm, the current enhances by ten times, reaching the value of 1.79 × 10<sup>-13</sup> A. The performance parameters of photo-to-dark current ratio (PDCR) and responsivity are calculated to be 8.2 and 5.2 mA/W, respectively, at 10 V. A stable multicycle response of the PD is observed on testing the device up to a high temperature of 473 K. The responsivity is found to increase with temperature, giving a maximum value of 30 mA/W at 473 K, thereby establishing the high-temperature performance of the deep UV PD.<br/><b>References </b><br/>[1] S. Kaushik, R. Singh, <i>Adv. Opt. Mater.</i> <b>2021</b>, <i>2002214</i>, 1.<br/>[2] S. Kaushik, S. Sorifi, R. Singh, <i>Photonics Nanostructures Fundam. Appl.</i> <b>2021</b>, <i>43</i>, 100887.<br/>[3] G. Cassabois, P. Valvin, B. Gil, <i>Nat. Photonics</i> <b>2016</b>, <i>10</i>, 262.<br/>[4] L. H. Li, Y. Chen, <i>Adv. Funct. Mater.</i> <b>2016</b>, <i>26</i>, 2594.<br/>[5] W. Zheng, R. Lin, Z. Zhang, F. Huang, <i>ACS Appl. Mater. Interfaces</i> <b>2018</b>, <i>10</i>, 27116.

Keywords

2D materials | lithography (deposition)

Symposium Organizers

Zakaria Al Balushi, University of California, Berkeley
Olga Kazakova, National Physical Laboratory
Su Ying Quek, National University of Singapore
Hyeon Jin Shin, Samsung Advanced Institute of Technology

Symposium Support

Bronze
Applied Physics Reviews | AIP Publishing
ATTOLIGHT AG
Penn State 2DCC-MIP

Publishing Alliance

MRS publishes with Springer Nature