MRS Meetings and Events

 

SB02.02.02 2024 MRS Spring Meeting

Effects of Processing-Induced Contamination on Organic Electronic Devices

When and Where

Apr 23, 2024
2:00pm - 2:15pm

Room 437, Level 4, Summit

Presenter

Co-Author(s)

Ian Jacobs1,Dimitrios Simatos1,Ilya Dobryden2,Malgorzata Nguyen1,Achilleas Savva1,Deepak Venkateshvaran1,Mark Nikolka1,Jerome Charmet3,Leszek Spalek1,Mindaugas Gicevičius1,Youcheng Zhang1,Guillaume Schweicher4,Duncan Howe1,Sarah Ursel1,John Armitage1,Ivan Dimov1,Ulrike Kraft5,Weimin Zhang6,Maryam Alsufyani7,Iain McCulloch7,Róisín Owens1,Per Claesson8,Tuomas Knowles1,Henning Sirringhaus1

University of Cambridge1,RISE Research Institutes of Sweden2,HES-SO University of Applied Sciences Western Switzerland3,Université Libre de Bruxelles4,Max Planck Institute for Polymer Research5,King Abdullah University of Science and Technology6,University of Oxford7,KTH Royal Institute of Technology8

Abstract

Ian Jacobs1,Dimitrios Simatos1,Ilya Dobryden2,Malgorzata Nguyen1,Achilleas Savva1,Deepak Venkateshvaran1,Mark Nikolka1,Jerome Charmet3,Leszek Spalek1,Mindaugas Gicevičius1,Youcheng Zhang1,Guillaume Schweicher4,Duncan Howe1,Sarah Ursel1,John Armitage1,Ivan Dimov1,Ulrike Kraft5,Weimin Zhang6,Maryam Alsufyani7,Iain McCulloch7,Róisín Owens1,Per Claesson8,Tuomas Knowles1,Henning Sirringhaus1

University of Cambridge1,RISE Research Institutes of Sweden2,HES-SO University of Applied Sciences Western Switzerland3,Université Libre de Bruxelles4,Max Planck Institute for Polymer Research5,King Abdullah University of Science and Technology6,University of Oxford7,KTH Royal Institute of Technology8
Organic semiconductors are often touted as ‘defect tolerant’, however to date there have been relatively few systematic studies of the role of impurities on device performance. In particular, little attention has been paid to processing-induced contaminants, originating from e.g. the glovebox atmosphere or solvents, even though anecdotal reports have long indicated that such factors may be important.<br/>Here,[1] we present a systematic study of processing-induced contamination on the performance of indacenodithiophene-co-benzothiadiazole (IDTBT) organic field effect transistors (OFETs). We observe that glovebox vapor can result in film contamination, but that in gloveboxes with a typical carbon-based solvent trap, the dominant impurities are typically aliphatics such as vacuum pump oil, rather than aromatics typically used for spin coating. In clean gloveboxes, we observe that the solvent content in films is largely determined by the residual solvent vapor in the atmosphere, rather than annealing, due to the large surface to volume ratio of thin films.<br/>In addition, we find that most common plastic laboratory consumables, such as pipette tips, syringes, and even metal needles, leach contaminants into organic semiconductor solutions. In some cases, such as poly(dimethylsiloxane) (PDMS) coatings on metal needles, contamination leads to improvements in film wetting and device performance. However, in other cases, such as leachates from micropipettes, we observe strongly degraded device performance. Using NMR, we identify two primary contaminants (oleamide and glycerol monostearate) leaching from micropipette tips. These chemicals are both ampiphilic, and therefore could plausibly lead to increased electrostatic disorder, or the formation of hydrophilic inverse micelles. Tellingly, quartz crystal microbalance measurements reveal that uncontaminated IDTBT films are entirely hydrophobic, while contaminated films swell by 20% upon exposure to water, suggesting that previous studies on the role of water uptake in IDTBT may have been dominated by impurities. Our results promisingly suggest that intrinsic OFET performance may actually be more stable than previously thought. However, they are also broadly relevant to a wide range of materials and devices fabricated from solution, and suggest important strategies to limit contamination and increase experimental reproducability,<br/><br/>[1] D. Simatos,* I.E. Jacobs,* et al. Small Methods, 2023, 2300476

Keywords

electrical properties | nuclear magnetic resonance (NMR)

Symposium Organizers

Xiaodan Gu, University of Southern Mississippi
Chad Risko, University of Kentucky
Bob Schroeder, University College London
Natalie Stingelin, Georgia Institute of Technology

Symposium Support

Bronze
MDPI AG

Publishing Alliance

MRS publishes with Springer Nature