Naoya Shibata1
The University of Tokyo1
Differential phase contrast scanning transmission electron microscopy (DPC STEM) is a powerful technique for directly characterizing local electromagnetic field distribution inside materials and devices. In combination with tilt-scan averaging system [1,2] for suppressing diffraction contrasts, DPC STEM can be applicable to local electromagnetic field imaging even in the vicinity of crystalline defects such as heterointerfaces and grain boundaries [3,4]. The next step is to apply this technique for materials under various external conditions from low temperatures to high temperatures, electromagnetic biasing, mechanical loading and so on. In this talk, some resent developments and applications along this direction will be discussed.<br/><br/>[1] Y. Kohno et al., <i>Microscopy</i>, 71, 111-116 (2022).<br/>[2] S. Toyama et al., <i>Ultramicroscopy</i>, 238, 113538 (2022).<br/>[3] S. Toyama et al., <i>Nature Nanotech.</i>, 18, 521-528 (2023).<br/>[4] S. Toyama et al., <i>submitted</i>.<br/>[5] This work is supported by JST ERATO grant number JPMJER2202 and the JSPS KAKENHI (grant number 20H05659).