Advancing Research with Combined Synchrotron Techniques at 7-BM NSLS II

At the 7-BM, NSLS II, we've developed combined synchrotron techniques for materials characterization, particularly X-ray absorption spectroscopy (XAS)/X-ray diffraction (XRD) and XAS/ Diffuse Reflectance Infrared Fourier Transform Spectroscopy (DRIFTS). These combined approaches yield numerous advantages including comprehensive analysis, real-time monitoring, and the maximization of data yield during valuable beamtime. Notably, their integration often reveals unexpected material properties and bridges gaps across varied research areas.<br/>The combination of XRD and XAS offers an all-encompassing perspective on material structure/properties. XRD examines phase identification, crystal structure, and other microstructural properties, while XAS studies the electronic configurations, oxidation states, and the intricacies of local coordination.<br/>With XAS elucidating details of the catalyst structure and DRIFTS offering a snapshot of surface interactions and molecular dynamics, this combination proves to be a powerful tool for gaining a comprehensive view of catalytic reactions.<br/>Leveraging these integrated techniques at the 7-BM NSLS II, we not only enhance our understanding of material properties but also set the stage for future innovations in diverse research fields.