Direct Imaging of Charge Distribution at Crystalline Defects by Scanning Transmission Electron Microscopy

Differential phase contrast imaging in aberration-corrected scanning transmission electron microscopy (DPC STEM) enables to directly probe local charge distribution around crystalline defects down to the atomic dimensions. In the present study, we introduce recently developed magnetic-field-free STEM with tilt-scan averaging system and demonstrate quantitative imaging of local charge distribution around crystalline interfaces at sub-nm resolution. We further show the possibility of local magnetic structure imaging near crystalline defects by the technique. Several on-going STEM developments and material application results will be also presented.