Naoya Shibata1
The University of Tokyo1
Differential phase contrast scanning transmission electron microscopy (DPC STEM) is a powerful technique for directly characterizing local electromagnetic field distribution inside materials and devices. In recent years, new magnetic objective lens system that realizes a magnetic field free environment at the sample position has been developed [1]. The novel electron microscope with this new objective lens system (Magnetic-field-free Atomic Resolution STEM: MARS) combined with DPC imaging is very useful for charactering many important topological structures. In this talk, some resent applications using MARS will be presented. The topics include atomic-scale grain boundary structure analysis in Fe-Si soft magnet [2], domain wall width measurements in magnets [3], magnetic field imaging of spin devices [4], domain imaging in magnetic quasicrystals, imaging of magnetic skyrmions, imaging of ferroelectric domain walls and so on.<br/>[1] N. Shibata et al., <i>Nature Comm.</i> 10, 2380 (2019).<br/>[2] T. Seki et al., <i>submitted</i>.<br/>[3] Y.O. Murakami et al., <i>submitted</i>.<br/>[4] Y. Kohno et al., <i>submitted</i>.<br/>[5] This work is supported by JST ERATO grant number JPMJER2202 and the JSPS KAKENHI (grant numbers 20H05659 and 19H05788).