MRS Meetings and Events

 

EL03.03.04 2023 MRS Fall Meeting

Ferroelectric Domain Observations with Helium Ion Microscopy

When and Where

Nov 27, 2023
4:00pm - 4:15pm

Hynes, Level 1, Room 107

Presenter

Co-Author(s)

Dong-Jik Kim1,Valentin Hevelke1,2,Jürgen Albert1,Adnan Hammud3,Sebastian Schmitt1,Young Jai Choi4,Veeresh Deshpande1,Catherine Dubourdieu1,2

Helmholtz-Zentrum Berlin fuer Materialien und Energie1,Freie Universitaet Berlin2,Fritz-Haber Institute of the Max-Planck Society3,Yonsei University4

Abstract

Dong-Jik Kim1,Valentin Hevelke1,2,Jürgen Albert1,Adnan Hammud3,Sebastian Schmitt1,Young Jai Choi4,Veeresh Deshpande1,Catherine Dubourdieu1,2

Helmholtz-Zentrum Berlin fuer Materialien und Energie1,Freie Universitaet Berlin2,Fritz-Haber Institute of the Max-Planck Society3,Yonsei University4
We present a systematic demonstration of the capability of helium ion microscopy (HIM) to visualize the polar and nonpolar domains in ferroelectric LiNbO<sub>3</sub> and ErMnO<sub>3</sub> single crystals. Through a wide range of acceleration voltages and beam currents of He<sup>+</sup> ions, HIM reproduces domain and domain wall maps with significant spatial resolution, consistent with the observations by piezoresponse force microscopy and conductive atomic force microscopy at the same locations. In the HIM domain images, the contrast of the polar domains with out-of-plane polarization can be attributed to the differences in the surface potential or the work function between oppositely poled domains. Intriguingly, HIM also exhibits contrast for nonpolar domains with in-plane polarization. During initial HIM scanning on the nonpolar surface of an ErMnO<sub>3</sub> single crystal, only dmain walls are visible, but consecutive scanning leads to the growth of domain contrast along its polar axis, implying a complex interaction between He+ ion implantation and the bulk photovoltaic effect of the ferroelectric materials. Our observations make HIM included in the list of the characterization tools for ferroelectric domains.

Keywords

field ion microscopy | scanning probe microscopy (SPM)

Symposium Organizers

John Heron, University of Michigan
Johanna Nordlander, Harvard University
Bhagwati Prasad, Indian Institute of Science
Morgan Trassin, ETH Zurich

Symposium Support

Bronze
Kepler Computing
SONERA

Publishing Alliance

MRS publishes with Springer Nature