In-Situ Characterization by Atomic Force Microscopy

Atomic force microscopy, as a platform for implementing and characterizing functional materials on the micro/nano-scale, was developed and will be introduced here from the basics, such as scanning modes, influence of cantilever tip, force measurements and other advanced applications. Particularly, in-situ characterization of different morphologies, monitoring shape reconfiguration of structured surfaces, particles and fibers during active movement will be discussed.<br/>Micro/nano-technologies of soft actuators<br/>The design/fabrication, functionalization, actuation, and localization of soft actuators on micro/nanoscale will be introduced. The principles of different actuation methods and their limitations will be analyzed. Examples of biomedical applications, micro-/nanorobots or sensors will be presented. The key challenges and future development directions will be discussed.