MRS Meetings and Events

 

QT11.08.02 2022 MRS Spring Meeting

Critical Current Measurements of Cuprate Thin Films in Pulsed Magnetic Fields

When and Where

May 11, 2022
2:00pm - 2:15pm

Hawai'i Convention Center, Level 3, 304A

Presenter

Co-Author(s)

Christopher Mizzi1,Fedor Balakirev1,Ivan Nekrashevich1,Maxime Leroux2,Masashi Miura3,Jens Haenisch4,Boris Maiorov1

Los Alamos National Laboratory1,Toulouse National High Magnetic Field Laboratory2,Seikei University3,Karlsruhe Institute of Technology4

Abstract

Christopher Mizzi1,Fedor Balakirev1,Ivan Nekrashevich1,Maxime Leroux2,Masashi Miura3,Jens Haenisch4,Boris Maiorov1

Los Alamos National Laboratory1,Toulouse National High Magnetic Field Laboratory2,Seikei University3,Karlsruhe Institute of Technology4
A detailed understanding of vortex pinning and dynamics is imperative for technological applications of type II superconductors. In addition, it is of fundamental interest to explore vortex solids at elevated fields only accessible in pulsed magnets. One particularly powerful approach to probe vortex physics is through nonlinear electrical transport measurements. However, such characterization in high-temperature superconductors requires high magnetic fields owing to the large critical fields of these materials. Pulsed-field magnets are often used to access the magnetic fields (H) necessary to study high-temperature superconductors, but their short pulse durations (~50 ms) present technical complications for nonlinear current measurements and their large dH/dt (~1000 T/s) values raise questions about the vortex dynamics regime. In this talk, we use the recently developed non-destructive, nonlinear electrical transport capabilities in pulsed fields [1] to explore critical current and critical fields in YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-x</sub> thin films with different, artificial pinning centers, and demonstrate the latest advances in this technique. We also explore the influence of the irreversibility line on critical currents at low temperatures and in fields up to 60 T.<br/><br/>[1] M. Leroux, F.F. Balakirev, M. Miura, K. Agatsuma, L. Civale, and B. Maiorov, <i>Phys. Rev. Appl.</i> <b>11</b>, 054005 (2019).

Keywords

electrical properties | thin film

Symposium Organizers

Paolo Mele, Shibaura Institute of Technology
Valeria Braccini, CNR - SPIN
Kazumasa Iida, Nagoya Univ
Qiang Li, Stony Brook University/Brookhaven National Laboratory

Symposium Support

Silver
SuperOx Japan

Bronze
SuNAM Co., Ltd.

Publishing Alliance

MRS publishes with Springer Nature