MRS Meetings and Events

 

EQ01.08.03 2022 MRS Spring Meeting

β-Ga2O3 Heterojunction Field-Effect Transistors Prepared via UV Laser-Assisted p-Doping of WSe2

When and Where

May 12, 2022
9:15am - 9:30am

Hawai'i Convention Center, Level 3, 318B

Presenter

Co-Author(s)

Sanghyun Moon1,Jinho Bae2,Dongryul Lee2,Jihyun Kim1

Seoul National University1,Korea University2

Abstract

Sanghyun Moon1,Jinho Bae2,Dongryul Lee2,Jihyun Kim1

Seoul National University1,Korea University2
Beta gallium oxide (β-Ga<sub>2</sub>O<sub>3</sub>) is a semiconductor material that has recently become the focus of research for next-generation high-power devices. The application of β-Ga<sub>2</sub>O<sub>3</sub> in high-power devices is propitious due to its features including the ultra-wide bandgap energy of 4.85 eV, the large breakdown field of ~8 MV/cm (estimated), and high Baliga’s figure of merit of approximately 3214. From the device fabrication point of view, the monoclinic structure of a β-Ga<sub>2</sub>O<sub>3</sub> crystal with an anisotropic unit cell allows the simple fabrication of low-scale β-Ga<sub>2</sub>O<sub>3</sub> devices through mechanical exfoliation. However, p-doping of β-Ga<sub>2</sub>O<sub>3</sub> is mostly unachievable due to its natural n-type conductivity of β-Ga<sub>2</sub>O<sub>3</sub> attributed to the oxygen vacancies in its crystal. This limits the application of β-Ga<sub>2</sub>O<sub>3</sub> in integrated devices where the semiconductor substrate requires both n- and p-doped areas. Various methods to incorporate the n-type β-Ga<sub>2</sub>O<sub>3</sub> and a p-type/ambipolar material into a p-n heterojunction are being studied to address such problems. Many of the materials studied for this reason are transition metal dichalcogenides (TMDs). TMDs have a unique crystal structure composed of layers stacked on one another by interplanar van der Waals forces. The electrical and structural features stemming from such a unique structure are favorable for the fabrication of low-scale high-performing devices. These features include high in-plane carrier mobility, atomic-scale thickness, and atomically clean surface enabling the TMDs to form heterostructures with other materials via van der Waals interaction. In this work, tungsten diselenide (WSe<sub>2</sub>) is incorporated with β-Ga<sub>2</sub>O<sub>3</sub> to form the p-n heterojunction. WSe<sub>2</sub> exhibits ambipolar conductivity which can be modified to either n- or p-type by further processing, which includes argon plasma treatment, ultraviolet/ozone treatment, and laser-assisted oxidation. In this work, laser-assisted oxidation was used to selectively oxidize the WSe<sub>2</sub> and to minimize any unwanted side-effects on the β-Ga<sub>2</sub>O<sub>3</sub> of the WSe<sub>2</sub>/β-Ga<sub>2</sub>O<sub>3</sub> heterojunction.<br/>In this work, β-Ga<sub>2</sub>O<sub>3</sub> and WSe<sub>2</sub> flakes were obtained through mechanical exfoliation using an adhesive tape. β-Ga<sub>2</sub>O<sub>3</sub> flakes were dry-transferred onto Si/SiO<sub>2</sub> substrates before Ti/Au (50/100 nm) source/drain electrodes, defined by electron-beam (e-beam) lithography, were deposited using an e-beam evaporator. Rapid thermal annealing was conducted in low vacuum (~10<sup>-2</sup> Torr) at 500°C for 60 s to form Ohmic Ti/β-Ga<sub>2</sub>O<sub>3</sub> contacts. WSe<sub>2</sub> flakes were dry-transferred onto a desired position on the β-Ga<sub>2</sub>O<sub>3</sub> channels. Pt/Au (20/80 nm) source/drain electrodes of the WSe<sub>2</sub> channel were defined by e-beam lithography and were deposited using an e-beam evaporator. Thermal annealing was conducted in high vacuum (~6×10<sup>-6</sup> Torr) at 200°C for 120 min to improve the Pt/WSe<sub>2</sub> contact. 325 nm laser with an intensity of 0.135 mW was utilized to selectively oxidize the WSe<sub>2</sub> in the WSe<sub>2</sub>/β-Ga<sub>2</sub>O<sub>3</sub> heterojunction field-effect transistor (HJFET).<br/>The fabricated WSe<sub>2</sub>/β-Ga<sub>2</sub>O<sub>3</sub> p-n diode exhibited a distinct rectifying behavior with an outstanding ideality factor of 1.16 and showed a five-order-of-magnitude decrease in its on-resistance after laser-assisted p-doping of WSe<sub>2</sub>, leading to a rectification ratio of ~10<sup>6</sup>. The β-Ga<sub>2</sub>O<sub>3</sub> HJFET with a WSe<sub>2</sub> top-gate exhibited excellent FET characteristics including stable current saturation properties, an on/off ratio of ~10<sup>7</sup>, a field-effect mobility of 10.84 cm<sup>2</sup>/Vs, and a subthreshold swing of 76.84 mV/dec. The eminent overall properties of the device can be attributed to the formation of p-n heterojunction through the selective p-doping of WSe<sub>2</sub> and a high-quality WSe<sub>2</sub>/β-Ga<sub>2</sub>O<sub>3</sub> interface leading to the increase of the depletion width of the β-Ga<sub>2</sub>O<sub>3</sub> channel. This work demonstrates a low-scale high-quality β-Ga<sub>2</sub>O<sub>3</sub> HJFET with a high switching speed and expands the potential applications of β-Ga<sub>2</sub>O<sub>3</sub>-based high-power devices by incorporating the n-type β-Ga<sub>2</sub>O<sub>3</sub> with the p-doping controllability of WSe<sub>2</sub>.

Keywords

nanostructure | oxide

Symposium Organizers

Robert Kaplar, Sandia National Laboratories
Srabanti Chowdhury, Stanford University
Yoshinao Kumagai, Tokyo University of Agriculture and Technology
Julien Pernot, University of Grenoble Alpes

Publishing Alliance

MRS publishes with Springer Nature