MRS Meetings and Events

 

SF01.08.01 2022 MRS Spring Meeting

In Situ Cathodoluminescence in Gadolinia Doped Ceria Under High Energy Electron Irradiation

When and Where

May 11, 2022
5:00pm - 7:00pm

Hawai'i Convention Center, Level 1, Kamehameha Exhibit Hall 2 & 3

Presenter

Co-Author(s)

Pooreun Seo1,Jean-Marc Costantini2,Syo Matsumura1,Kazuhiro Yasuda1

Kyushu University1,University of Paris-Saclay2

Abstract

Pooreun Seo1,Jean-Marc Costantini2,Syo Matsumura1,Kazuhiro Yasuda1

Kyushu University1,University of Paris-Saclay2
Ceramic oxides with fluorite crystal structure, such as CeO<sub>2</sub> (ceria, Fm-3m) have been surrogates of nuclear fuels and transmutation targets with excellent radiation resistance. Gd<sub>2</sub>O<sub>3</sub> (Ia-3) is doped in ceria (GDC) to simulate the burnable poison doping in nuclear fuels. In ceria, intrinsic oxygen vacancies (V<sub>O</sub><sup>●●</sup>) (using the Kröger-Vink notation) are created to provide charge compensation when Ce<sup>4+</sup> ions (4f<sup>0</sup>) are reduced to Ce<sup>3+</sup> ions (4f<sup>1</sup>). In GDC, oxygen vacancies are also produced by the substitution of Ce<sup>4+</sup> ions for Gd<sup>3+</sup> (4f<sup>7</sup>) ions (Gd<sub>Ce</sub><sup>′</sup>).<br/>Under high energy electron irradiation, when kinetic energy higher than the displacement threshold energy of oxygen ions (E<sub>d,O</sub>) is transferred to GDC, an F center (oxygen point defect with trapped electrons) is generated by elastic electron-nucleus collisions. This study investigates the production of the F center and its charge states in GDC in a high voltage electron microscope (HVEM) through <i>in-situ </i>cathodoluminescence (CL) spectroscopy under high energy electron irradiation.<br/>In this study, GDC samples (Ce<sub>1-x</sub>Gd<sub>x</sub>O<sub>2-</sub><sub>δ</sub>, x= 0-0.5) fabricated by sintering in the air were used. The lattice structure of sintered samples was analyzed by X-ray diffraction (XRD) with Cu Kα radiation (30 mA, 40 kV) X-ray source from 20° to 90° (2θ) at a step size of 0.01° at room temperature.<br/>A HVEM in the Ultramicroscopy Research Center of Kyushu University was operated to produce oxygen point defects in the samples. This facility is installed with an optical fiber probe with 46° off from the electron beam line thereby <i>in-situ </i>CL from the samples can be detected under irradiation conditions. The electron energies ranged from 400 to 1250 keV higher than the E<sub>d</sub><sub>,O</sub>. Temperature was controlled from 300 K to 100 K using a liquid N<sub>2</sub> cooling holder. The <i>in-situ </i>CL were also measured by using SEM under low energy electron (20 keV) irradiation which does not produce oxygen displacement.<br/>The XRD experimental results showed that the lattice parameter was increased with Gd<sub>2</sub>O<sub>3</sub> concentration. Also, the crystal structure was changed for the high concentration of GDC samples with the values of x=0.4 and 0.5. The crystallite size and micro strain were also evaluated.<br/><i>In-situ </i>CL spectra measured from GDC samples by a HVEM and SEM were decomposed into broad bands using Gaussian functions. According to the previous reports<sup> [1]</sup>, the CL bands were emitted from Ce<sup>3+</sup> ions (2.1 ~ 2.9 eV) induced by charge compensation of oxygen vacancies. Also the CL bands centered at 4.2 eV was emitted from F<sup>+</sup> centers (one electron trapped F center, V<sub>O</sub><sup>●</sup>) produced by elastic displacement damage. The photon energies of CL bands emitted from GDC samples were similar to those of ceria. However, the integrated CL intensities of each band tended to depend on Gd<sup>3+</sup> dopant concentration since the oxygen vacancies in GDC are mainly controlled by the doping concentrations. The CL emission bands were also integrated as a function of energy and temperature. The real-time charge states of the point defects and Ce<sup>3+</sup> ions under high energy electron irradiation conditions will be discussed by <i>in-situ </i>CL spectroscopy.<br/>Ref. [1] J.M. Costantini, P. Seo, K. Yasuda, AKM S.I. Bhuian, T. Ogawa, D. Gourier, <i>J. Lumi.</i> 226 (2020) 117379.

Keywords

defects | luminescence | transmission electron microscopy (TEM)

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