MRS Meetings and Events

 

NM03.15.01 2022 MRS Spring Meeting

Exploring the Etching Mechanism of Monoatomic Aluminium Layers During MXene Synthesis

When and Where

May 24, 2022
8:45pm - 9:15pm

NM03-Virtual

Presenter

Co-Author(s)

Hee-Tae Jung1,2

Korea Advanced Institute of Science & Technology1,KAIST Institute for Nanocentury2

Abstract

Hee-Tae Jung1,2

Korea Advanced Institute of Science & Technology1,KAIST Institute for Nanocentury2
<b>MXenes are synthesized by selective etching of <i>A</i>-group element from bulk MAX phases via wet etching process. Because the <i>A</i>-group elements between <i>M</i> layers has atomic-scale layer thickness and wide lateral dimension (~ 15 μm) with strong chemical bonds between <i>A</i> and <i>M</i> elements in MAX phases,</b> <b>selective removal process of A layer should be very complicate</b>. <b>Thus, understanding where the etching of A<i>-</i>element layer starts and how it proceeds depending on types of etchants is the first step, and essential to obtaining high quality of MXenes. In spite of intensive efforts, exploring the etching mechanism of the atomic Al layer is still uncertain.</b> <b>Herein, we report for the first time the etching mechanism of Al atomic layers from Ti<sub>3</sub>AlC<sub>2</sub> MAX phases by observing the structural and morphological changes of Ti<sub>3</sub>C<sub>2</sub>T<sub>x</sub> MXenes as a function of etching time via high-resolution electron microscopy. We demonstrate that the atomic Al layers are etched by two distinct mechanisms depending on the types of wet-etchants: For LiF/HCl etchant, the etching begins from either defect edges or/and edges of Al atomic layers exposed at side surface of Ti<sub>3</sub>AlC<sub>2</sub> MAX top (or bottom) layers, which are relatively weak Ti-Al bonding sites. The etching proceeds from the edges into inner Al atoms in a single Al layer, and at the same time etches Al atoms at under layers by attacking weak Ti-Al bonding sites generated during the etching. For HF and NH<sub>4</sub>HF<sub>2</sub> etchants, however, excess amount of HF starts to attack not only edges of atomic Al layers exposed at side surface of Ti<sub>3</sub>AlC<sub>2</sub> MAX top (or bottom) layers, but also grain boundary of poly-crystalline Ti<sub>3</sub>AlC<sub>2</sub> MAX multi-layer. Hence, more atomic Al layers are exposed to etching solutions for further etching, leading to fully etched multi-layer MXene particles.</b>

Keywords

2D materials | surface chemistry | transmission electron microscopy (TEM)

Symposium Organizers

Babak Anasori, Indiana University-Purdue University
Christina Birkel, Arizona State University
Chong Min Koo, Sungkyunkwan University
Valeria Nicolosi, Trinity College Dublin

Symposium Support

Platinum
Murata Manufacturing Co., Ltd.

Gold
Korea Institute of Science and Technology

Bronze
HORIBA Scientific
MilliporeSigma
Princeton Scientific Corp.

Publishing Alliance

MRS publishes with Springer Nature