MRS Meetings and Events

 

SF06.03.08 2022 MRS Fall Meeting

Correlation of Oxygen Nonstoichiometry on Chemical Expansion in LCCO Thin Films

When and Where

Nov 29, 2022
11:00am - 11:15am

Sheraton, 3rd Floor, Fairfax A/B

Presenter

Co-Author(s)

Hendrik Wulfmeier1,2,Dhyan Kohlmann1,Thomas Defferriere2,Harry Tuller2,Holger Fritze1

Clausthal University of Technology1,Massachusetts Institute of Technology2

Abstract

Hendrik Wulfmeier1,2,Dhyan Kohlmann1,Thomas Defferriere2,Harry Tuller2,Holger Fritze1

Clausthal University of Technology1,Massachusetts Institute of Technology2
Mixed electronic/ionic conductors (MIECs) are of great technological interest with applications, for example, in solid oxide fuel cells (SOFCs). Reduction of operation temperatures is needed both for extended life and reduced costs, but this increases the demand for more electrocatalytically active electrodes. The MIEC layer compound lanthanum cerium cuprate (La<sub>1–x</sub>Ce<sub>x</sub>CuO<sub>4+</sub><sub>δ</sub>, LCCO) shows promise in this regard given relatively high electronic conductivities at reduced temperatures [1], as well as the ability to accommodate both oxygen excess and deficiency, the latter making it an attractive candidate for both the SOFC cathode and anode [2], and thus a promising material for reversible SOFCs. In this work, oxygen nonstoichiometry in LCCO thin films is characterized in the temperature range of 500 to 700 °C. The determination of the oxygen nonstoichiometry in thin films is a challenging task, especially at elevated temperatures. Piezoelectric nanobalances, based on catangasite (CTGS, Ca<sub>3</sub>TaGa<sub>3</sub>Si<sub>2</sub>O<sub>14</sub>) single crystals, were applied to monitor changes in δ in these thin oxide films [3] reaching values of up to δ = –0.118 at e.g. 600 °C and log (<i>p</i><sub>O2</sub>) = –13.<br/>Changing oxygen content in LCCO films, for positive or negative values of δ, results in chemical expansion that can lead to stresses resulting in cracks and malfunction. In the case of thin films this chemical expansion occurs mainly perpendicular to the substrate. In lateral direction of the substrate, mechanical stress is generated leading to substrate bending. The surface near film expansion is characterized by X-ray diffraction under temperature and <i>p</i><sub>O2</sub> variation. We characterize the overall thin-film expansion of LCCO films deposited on single crystalline yttria stabilized zirconia (YSZ) substrates acting as oxygen pumping cells by high-temperature laser-Doppler vibrometry (LDV) [4]. An applied voltage results in an oxygen activity which corresponds to an effective oxygen partial pressure and can be calculated via the Nernst relation. When a sinusoidal excitation voltage is applied to the cell, the reversible <i>breathing</i> of the LCCO film can be detected via LDV. If the excitation frequency is low enough, a quasi-stationary state is reached. At 500 °C and an excitation frequency of 100 µHz, positive and negative voltages of +/– 0.5 V correspond to oxygen activities of log (<i>a</i><sub>O2</sub>) = –10 and +10, respectively. In both cases thin-film expansion of only a few nm, results in total displacements (i.e. thin-film expansion plus substrate bending) of 64 nm and 239 nm respectively.<br/>[1] C.S. Kim, H.L. Tuller: Sol. State Ion., 320, 233-238 (2018) DOI: 10.1016/j.ssi.2018.03.015<br/>[2] Q. Liu et al.: Int. J. Hydrogen Energy, 46, 9818-9825 (2021) DOI: 10.1016/j.ijhydene.2020.06.063<br/>[3] S. Schröder et al.: Appl. Phys. Lett., 112, 213502 (2018) DOI: 10.1063/1.5025389<br/>[4] H. Wulfmeier et al.: Z. Phys. Chem., 236, 1013–1053 (2022) DOI: 10.1515/zpch-2021-3125

Keywords

diffusion | in situ | thin film

Symposium Organizers

Cody Dennett, Massachusetts Institute of Technology
Marat Khafizov, The Ohio State University
Lucas Lindsay, Oak Ridge National Laboratory
Zhiting Tian, Cornell University

Publishing Alliance

MRS publishes with Springer Nature