MRS Meetings and Events

 

SF05.02.03 2022 MRS Fall Meeting

Atomic Scale Structure and Electronic Structure of Defects at Misfit Dislocations in CeO2/MgO Heterostructure

When and Where

Nov 28, 2022
2:30pm - 2:45pm

Sheraton, 3rd Floor, Gardner A/B

Presenter

Co-Author(s)

Pratik Dholabhai1

Rochester Institute of Technology1

Abstract

Pratik Dholabhai1

Rochester Institute of Technology1
Among the numerous functionalities of mismatched oxide heterostructures and thin films, one of their most promising energy applications is in solid oxide fuel cell (SOFC) electrolytes. Epitaxial growth of oxide thin films on substrates above critical thickness result in the formation of misfit dislocations. These functional extended defects influence key material properties of thin film SOFC electrolytes. Nevertheless, fundamental understanding of the atomic scale structure and electronic structure of misfit dislocations and their intricate interaction with mobile oxygen vacancies at functional oxide interfaces is lacking. In this work, first principles density functional theory was used to elucidate the atomic scale structure and electronic structure of misfit dislocations for experimentally observed epitaxy in CeO<sub>2</sub>/MgO heterostructure. Rotation of CeO<sub>2</sub> thin film is uncovered as one potential mechanism eliminating the surface dipole, which results in experimentally observed epitaxy. In Gd-doped CeO<sub>2</sub> thin film, thermodynamic stability and electronic structure of oxygen vacancies in the neighborhood of misfit dislocations will be contrasted against their behavior in the bulk and at surfaces. Changes in the electronic density of states and interface electronic charge transfer due to defect formation in the vicinity of misfit dislocations and their impact on ionic transport will be discussed. Present results are instrumental in understanding the intricate interplay between misfit dislocations, dopants, and oxygen vacancies and their ultimate impact on ionic transport in thin film SOFC electrolytes.<br/><br/>We acknowledge support from NSF CAREER Award DMR-2042311.

Keywords

dislocations | electronic structure | oxide

Symposium Organizers

Yuanyuan Zhou, Hong Kong Baptist University
Carmela Aruta, National Research Council
Panchapakesan Ganesh, Oak Ridge National Laboratory
Hua Zhou, Argonne National Laboratory

Publishing Alliance

MRS publishes with Springer Nature