Call for Papers

Please contact the symposium organizers with questions.

In recent years, aberration-corrected transmission electron microscopy (TEM) and synchrotron X-ray techniques coupled with advanced detectors and data science techniques have enabled the study of materials structure and functional dynamics with unprecedented spatiotemporal resolution. For instance, in situ/operando electron microscopy are being employed to investigate the transformation of energy materials (catalysts, battery electrodes, etc.) at the atomic scale. The new generation of synchrotron X-ray technology with greatly improved coherence offers emerging opportunities for in situ characterization of the structural and chemical evolution of functional materials using a suite of techniques, including imaging, scattering and spectroscopy. Further, integrated electron and X-ray microscopy provides insight into materials growth, transformation and degradation in application-relevant environments. Ptychography method in both electron and x-ray microscopy provides the record resolution for imaging of material structures. The newly developed data science (4D-STEM) and artificial intelligence algorithm speeds up the data analysis with improved accuracy and accelerates science discovery. The goal of this symposium is to bring together renowned researchers in materials science and engineering, chemistry, and physics and to promote the crosstalk and development of future directions in the characterization of materials dynamics with advanced TEM and X-ray techniques and explore the correlation with other characterization methods.

Topics will include:

• Phase transition phenomena in materials (temperature, pressure, environmental)
• Microscopy of materials growth
• Operando study of catalysis
• Evolution of energy materials (eg. Li/Na ion battery)
• External-driven processes of functional materials
• Self-assembly
• Ultrafast process of materials science
• Electron beam/x-ray interaction with materials
• Theoretical modeling of materials dynamics
• Advanced microscopy method

• A tutorial complementing this symposium is tentatively planned.

Invited Speakers (tentative):

• Ilke Arslan (Argonne National Laboratory, USA)
• Qian Chen (University of Illinois at Urbana-Champaign, USA)
• Jennifer Dionne (Stanford University, USA)
• Hongyou Fan (Sandia National Laboratories, USA)
• Peijun Guo (Yale University, USA)
• Martin Holt (Argonne National Laboratory, USA)
• Ido Kaminer (Technion, Israel Institute of Technology, Israel)
• Luxi Li (Argonne National Laboratory, USA)
• Ruiping Li (Brookhaven National Laboratory, USA)
• Eva Olsson (Chalmers University of Technology, Sweden)
• Eric Stach (University of Pennsylvania, USA)
• Tao Sun (University of Virginia, USA)
• Xijie Wang (Stanford University, USA)
• Haimei Zheng (Lawrence Berkeley National Laboratory, USA)
• Yimei Zhu (Brookhaven National Laboratory, USA)

Symposium Organizers