MRS Meetings and Events

 

EL01.05.01 2024 MRS Spring Meeting

Advancing Measurement Science for Microelectronics: CHIPS R&D Metrology Program

When and Where

Apr 24, 2024
1:30pm - 2:00pm

Room 348, Level 3, Summit

Presenter

Co-Author(s)

Marla Dowell1

National Institute of Standards and Technology1

Abstract

Marla Dowell1

National Institute of Standards and Technology1
The CHIPS and Science Act of 2022 called for NIST to “carry out a microelectronics research program to enable advances and breakthroughs….that will accelerate the underlying R&D for metrology of next-generation microelectronics and ensure the competitiveness and leadership of the United States….”, NIST is leveraging its measurement science expertise, standards development contributions, and stakeholder engagement practices to address the highest priority metrology challenges identified across industry, academia, and government agencies. The program expands upon NIST’s strong track record of supporting the semiconductor technology and manufacturing ecosystem by developing, advancing, and deploying measurement technologies that are accurate, precise, and fit-for-purpose. <br/> <br/>Under the CHIPS and Science Act of 2022, NIST is expanding its support of the microelectronics technology and manufacturing ecosystem by developing, advancing, and deploying measurement technologies that are accurate, precise, and fit-for-purpose.

Keywords

adsorption | self-assembly | surface chemistry

Symposium Organizers

Silvia Armini, IMEC
Santanu Bag, AsterTech
Mandakini Kanungo, Corning Incorporated
Gilad Zorn, General Electric Aerospace

Publishing Alliance

MRS publishes with Springer Nature