MRS Meetings and Events

 

CH04.06.02 2024 MRS Spring Meeting

N2 Electro-Activation over Ru using Operando Atom Probe Microscopy

When and Where

Apr 24, 2024
3:45pm - 4:00pm

Room 443, Level 4, Summit

Presenter

Co-Author(s)

Sten Lambeets1,Mark Wirth1,Shawn Kathmann1,Daniel Perea1

Pacific Northwest National Laboratory1

Abstract

Sten Lambeets1,Mark Wirth1,Shawn Kathmann1,Daniel Perea1

Pacific Northwest National Laboratory1
Challenges in the development of green electricity and energy storage challenges are leading us to consider NH<sub>3</sub> as a promising future zero-carbon fuel. The N<sub>2</sub> reduction reaction to NH<sub>3</sub> using electricity is extensively investigated with single atom electrocatalysts (SACs) recently showing promising results. Due to their morphology, the application of an electrical potential on SACs materials results in local High External Electric Fields (HEEFs) over the single atoms. If those effects present promising outcomes according to theoretical calculations<sup>1,2</sup>, the values of those HEEFs and the mechanisms involved remains largely unknown and unexplored. Atom Probe Microscopy (APM) such as Field Ion Microscopy (FIM) and Operando Atom Probe are ideal techniques to unravel those mechanisms at the nanoscale since they inherently rely on HEEFs for imaging. In this work, we will illustrate those capabilities with the room temperature N<sub>2</sub> dissociation over Ru case imaged at the nanoscale with FIM and OAP.We use the recently developed OAP technique<sup>3</sup> to effectively measure this dissociation over a 0001-oriented Ru specimen. After fixing a constant HEEF between 13 and 17 V/nm and the temperature at 300K, 1.4x10<sup>-7</sup>mbar N<sub>2</sub> pure gas is introduced in the analytic chamber. The HEEF either directly ionize N<sub>2</sub> or provoke its dissociation. Dissociated N(ads) are mainly detected over the Ru{1012} and Ru{2114} facets. The occurrence of one or the other processes is intimately linked to the local surface structures and the local HEEFs.<br/>FIM and OAP are capable to observe and estimate the HEEF necessary to trigger specific chemical reaction steps such as the N<sub>2</sub> dissociative adsorption (i.e. activation). With an accurate calculation of those HEEF, those values can be extrapolated to create new chemical and reactor system designed to perform N<sub>2</sub> activation at relatively low energy cost. In a context of electrification of chemical processes, APM can help pave the way to a deeper understanding of the physical laws involved in electrochemistry, as well as in chemistry in general.<br/><br/>Reference<br/><br/>[1] S.M.Kathmann, Phys.Chem.Chem.Phys. <b>23</b>, 23836 (2021).<br/>[2] M.L.Karahka&H.J.Kreuzer, Surf.Sci. <b>643</b>, 164(2016).<br/>[3] S.V.Lambeets <i>et al.</i> Top.Catal. 1606(2020)<br/><br/>&lt;!--![endif]----&gt;

Keywords

atom probe microscopy | chemical reaction | Ru

Symposium Organizers

Yuzi Liu, Argonne National Laboratory
Michelle Mejía, Dow Chemical Co
Yang Yang, Brookhaven National Laboratory
Xingchen Ye, Indiana University

Publishing Alliance

MRS publishes with Springer Nature