MRS Meetings and Events

 

EL03.05.01 2024 MRS Spring Meeting

Boron in The Back-End: Advances in Boron-Based Solids for Interconnect Applications

When and Where

Apr 24, 2024
10:15am - 10:45am

Room 346, Level 3, Summit

Presenter

Co-Author(s)

Michelle Paquette1

University of Missouri-Kansas City1

Abstract

Michelle Paquette1

University of Missouri-Kansas City1
Playing a less glamorous yet critically important role, the interconnect system requires relentless innovation to support more complex and higher-density device architectures. To meet future demands, we require a constant supply of novel and better materials, material fabrication methods, and material combinations. Known for their robust mechanical, chemical, thermal, and electrical properties, boron-based solids are a compelling alternative to silicon-based solids for a range of interconnect material needs, to include low-dielectric-constant (low-<i>k</i>) dielectrics, etch stops, diffusion barriers, hard masks, spacers, capping layers, and other patterning-assist layers. This talk with cover advances in boron-based solids, including BC and BN, for state-of-the-art interconnect applications, touching on fundamental materials science, layer-by-layer deposition techniques, and functional and patterning applications.

Keywords

atomic layer deposition | dielectric properties

Symposium Organizers

Serena Iacovo, imec
Vincent Jousseaume, CEA, LETI
Sean King, Intel Corp
Eiichi Kondoh, University of Yamanashi

Symposium Support

Silver
Tokyo Electron Limited

Bronze
CEA- Leti

Publishing Alliance

MRS publishes with Springer Nature