MRS Meetings and Events

 

QM04.06.04 2023 MRS Spring Meeting

Novel Scanning Probe Investigations of Domains and Domain Walls in Lithium Niobate

When and Where

Apr 12, 2023
11:30am - 11:45am

Marriott Marquis, Fourth Level, Pacific E

Presenter

Co-Author(s)

Jesi Maguire1,Hamza Waseem1,Charlotte Cochard2,Ray McQuaid1,Amit Kumar1,Marty Gregg1

Queen's University Belfast1,University of Dundee2

Abstract

Jesi Maguire1,Hamza Waseem1,Charlotte Cochard2,Ray McQuaid1,Amit Kumar1,Marty Gregg1

Queen's University Belfast1,University of Dundee2
Over the last 25 years, scanning probe microscopy techniques have revolutionised the way in which we understand ferroelectric domains and domain walls. This trend shows no sign of stopping. Here, for example, we have used two key imaging modes to investigate new characteristics of charged (head-to-head) conducting domain walls in single crystal LiNbO<sub>3</sub>: Kelvin Probe Force Microscopy (KPFM) and Charge Gradient Microscopy (CGM).<br/><br/>In detail, newly configured “high-voltage” in-situ KPFM (imaging relatively large voltages while driving current) has allowed us to explicitly determine the resistivity of conducting lithium niobate domain walls for the first time (without the confounding influence of contact resistance): conducting domain walls were written in x-cut lithium niobate films by partial poling between coplanar thin film electrodes. In-situ KPFM mapping of the interelectrode region was then performed, while driving current along the conducting walls. Knowing the current density and the potential gradient developed allowed room temperature "four-probe" wall conductivity to be explicitly determined.<br/><br/>Equally, the combination of KPFM and CGM has revealed interesting surface potential profiles, associated with the microstructure around the charged walls, and forced us to reconsider the fundamental imaging mechanism responsible for CGM contrast [1]: KPFM scans revealed a triangular potential profile perpendicular to a head-to-head wall, which was an almost perfect match to the integrated CGM signal obtained in the same region. This strongly suggests that CGM does not actually measure charge gradients, but rather potential gradients.<br/> <br/>[1] Maguire, J.R., Waseem, H., McQuaid, R.G., Kumar, A., Gregg, J.M. and Cochard, C., 2022. Imaging Ferroelectrics: Reinterpreting Charge Gradient Microscopy as Potential Gradient Microscopy. <i>Advanced Electronic Materials</i>, p.2101384.

Keywords

electrical properties | scanning probe microscopy (SPM)

Symposium Organizers

Albina Borisevich, Oak Ridge National Laboratory
Rohan Mishra, Washington University in St. Louis
Jayakanth Ravichandran, University of Southern California
Han Wang, Taiwan Semiconductor Manufacturing Company North America

Symposium Support

Bronze
JEOL USA, INC.

Publishing Alliance

MRS publishes with Springer Nature