MRS Meetings and Events

 

CH01.21.02 2023 MRS Fall Meeting

Charge Density in Nanorings from Scanning Force Microscopy

When and Where

Dec 5, 2023
9:00am - 9:15am

CH01-virtual

Presenter

Co-Author(s)

Fredy Zypman1,Moshe Gordon1,Benjamin Goykadosh1,Yonathan Magendzo1

Yeshiva University1

Abstract

Fredy Zypman1,Moshe Gordon1,Benjamin Goykadosh1,Yonathan Magendzo1

Yeshiva University1
Several systems of nanometer or sub–nanometer dimensions are electrically charged rings. For example, molecular pumps use electrically charged rings to link amino acids into growing peptides, the efficiency depending on charge magnitude and location. Knowledge of charge content is necessary to apply these pumps to assemble other architectures. More generally, charge plays a key role in the structure attained by large molecules when they self-assemble. Also, charged rings are current candidates as physical support of information storage for qubits for quantum computing. In addition, for applications in biosensing and nano-optoelectronics, micrometer and nanometer rings of charge have been synthesized from a variety of materials. For example, carbon nanorings with radii of a few have been obtained by self-assembly of carbonized pluronic P123. The most common gold nanoring has been synthesized by a variety of methods, while whole silver nanorings of diameter have been produced by solvothermal methods.<br/>These examples underscore the relevance of understanding electrostatic measurements at the nanoscale with the <b>SFM </b>(scanning force microscope), and in particular, to understand those measurements on charged ring structures. While the <b>SFM</b> sensor mechanically responds to electrostatic inputs, it is not straightforward to connect this response to the electrostatic content of the sample under study. Specifically, <b>SFM</b> records a force trace which varies as the sensor explores different regions of the sample. In this study, we propose a method to convert this force curve into charge density content in the sample. We first solve the direct problem, whereby the SFM force is computed from the assumed know charge density. Afterward, we move to the realistic practical situation in microscopy and address the inverse problem. In the inverse problem, forces are measured in each voxel of a volume region above the sample and, using that information as input, the charge on the ring is produced.

Keywords

atom probe microscopy | chemical composition | scanning probe microscopy (SPM)

Symposium Organizers

Liam Collins, Oak Ridge National Laboratory
Rajiv Giridharagopal, University of Washington
Philippe Leclere, University of Mons
Thuc-Quyen Nguyen, University of California, Santa Barbara

Symposium Support

Silver
Bruker
Digital Surf

Publishing Alliance

MRS publishes with Springer Nature