MRS Meetings and Events

 

DS02.02.02 2022 MRS Spring Meeting

Developing Capabilities to Predict Fatigue and Fracture Behavior of Additively Manufactured Parts Containing a Range of Pore and Grain Structures

When and Where

May 10, 2022
2:00pm - 2:15pm

Hawai'i Convention Center, Level 3, 313C

Presenter

Co-Author(s)

Jake Benzing1,Orion Kafka1,Newell Moser1,Enrico Lucon1,Tim Quinn1,Nik Hrabe1

National Institute of Standards and Technology1

Abstract

Jake Benzing1,Orion Kafka1,Newell Moser1,Enrico Lucon1,Tim Quinn1,Nik Hrabe1

National Institute of Standards and Technology1
Materials of known, repeatable properties that are resistant to fracture are of prime importance for structural applications, but additively manufactured (AM) parts often contain internal voids and heterogeneities at the microstructural level which reduces strength and repeatability. In this work, Ti-6Al-4V parts were manufactured with different scan lengths (20 mm to 90 mm) during electron beam melting powder bed fusion method, which produced crystallographic textures that do not match the texture assumed for most Ti-6Al-4V AM parts (&lt;001&gt;<sub>β</sub>-fiber in the build direction). The parts were also subjected to three different hot isostatic pressing (HIP) treatments, which are all effective in sealing internal porosity and manipulating texture and grain morphology. Validation of predicted mechanical behavior from a crystal plasticity model incorporates electron backscatter diffraction and X-ray computed tomography measurements conducted during and after tensile tests to failure. The high-cycle fatigue life and fracture toughness of specimens are predicted, based on observed changes in microstructures and defects. Our work shows potential for enabling rapid part design and qualification, beyond the Ti alloy system, by using microstructure-based predictive modeling to help identify and mitigate possible risk factors before conducting a physical build of an expensive aerospace or biomedical device component.

Keywords

scanning electron microscopy (SEM) | Ti | x-ray tomography

Symposium Organizers

Veruska Malavé, National Institute of Standards and Technology
Vitor Coluci, UNICAMP
Kun Fu, University of Delaware
Hui Ying Yang, SUTD

Symposium Support

Silver
National Institute of Standards and Technology (NIST)

Publishing Alliance

MRS publishes with Springer Nature