MRS Meetings and Events

 

EQ06.01.03 2022 MRS Spring Meeting

Plasma-assisted Atomic Layer Deposition of Monolayer AlOx on GaN for Surface Functionalization and Low-Resistance Contacts

When and Where

May 8, 2022
9:15am - 9:30am

Hawai'i Convention Center, Level 3, 314

Presenter

Co-Author(s)

Alex Henning1,Johannes Bartl1,Maximilian Christis1,Andreas Zeidler1,Simon Qian1,Oliver Bienek1,Chang-Ming Jiang1,Claudia Paulus1,Bernhard Rieger1,Martin Stutzmann1,Ian Sharp1

Technical University of Munich1

Abstract

Alex Henning1,Johannes Bartl1,Maximilian Christis1,Andreas Zeidler1,Simon Qian1,Oliver Bienek1,Chang-Ming Jiang1,Claudia Paulus1,Bernhard Rieger1,Martin Stutzmann1,Ian Sharp1

Technical University of Munich1
Atomic layer deposition (ALD) is an essential tool in semiconductor device fabrication that allows the growth of ultrathin and conformal films to precisely form heterostructures and tune interface properties. The self-limiting nature of the chemical reactions during ALD provides excellent control over the layer thickness and film properties. However, in contrast to idealized growth models, it is experimentally challenging to create continuous monolayers by ALD because surface inhomogeneities and precursor steric interactions result in island growth during film nucleation. Thus, the ability to create closed monolayers by ALD would offer new opportunities for controlling interfacial charge and mass transport in semiconductor devices, as well as for tailoring surface chemistry. Here, we report full encapsulation of <i>c</i>-plane gallium nitride (GaN) with an ultimately thin (~3 Å) aluminum oxide (AlO<sub>x</sub>) monolayer, which is enabled by the transformation of the GaN surface oxide into AlO<sub>x</sub> using a combination of trimethylaluminum (TMA) deposition and hydrogen plasma exposure.[1] The introduction of ultrathin AlO<sub>x</sub> significantly modifies the physical and chemical properties of the surface, decreasing the work function and introducing new chemical reactivity. The AlO<sub>x</sub>-terminated surface strongly reacts with phosphonic acids under standard conditions, which we exploited to create functional self-assembled monolayers with densities approaching the theoretical limit. Moreover, we show that surface band bending of <i>n</i>-type GaN is reduced by over 0.4 eV following the transformation of the gallium oxide layer into AlO<sub>x</sub>. As a consequence, we achieved a low contact resistance and Ohmic behavior before annealing of titanium-contacted <i>n</i>-doped GaN with interfacial AlO<sub>x</sub>. Given the high reactivity of TMA with surface oxides, the presented monolayer AlO<sub>x</sub> deposition scheme likely can be extended to other dielectrics and III-V-based semiconductors, with significant relevance for applications in optoelectronics, chemical sensing, and (photo)electrocatalysis.<br/>[1] Henning, A.; Bartl, J. D.; Zeidler, A.; Qian, S.; Bienek, O.; Jiang, C.-M.; Paulus, C.; Rieger, B.; Stutzmann, M.; Sharp, I. D. <i>Adv. Funct. Mater.</i> 2021, 31, (33), 2101441.

Keywords

atomic layer deposition | electronic structure | III-V

Symposium Organizers

Santanu Bag, Air Force Research Laboratory
Silvia Armini, IMEC
Mandakini Kanungo, Corning Incorporated
Hong Zhao, Virginia Commonwealth University

Symposium Support

Silver
Corning Inc

Bronze
NovaCentrix

Publishing Alliance

MRS publishes with Springer Nature