MRS Meetings and Events

 

EQ09.02.07 2022 MRS Fall Meeting

BaTiO3 Nanostructures on Si Fabricated by Neon Ion Milling

When and Where

Nov 28, 2022
4:00pm - 4:15pm

Sheraton, 2nd Floor, Back Bay D

Presenter

Co-Author(s)

Olaniyan Ibukun1,2,Sebastian Schmitt1,Dong-Jik Kim1,Jürgen Albert1,Rama Vasudevan3,Michael Zachman3,Veeresh Deshpande1,Catherine Dubourdieu1,2

Helmholtz-Zentrum Berlin für Materialien und Energie1,Freie Universität Berlin2,Oak Ridge National Laboratory3

Abstract

Olaniyan Ibukun1,2,Sebastian Schmitt1,Dong-Jik Kim1,Jürgen Albert1,Rama Vasudevan3,Michael Zachman3,Veeresh Deshpande1,Catherine Dubourdieu1,2

Helmholtz-Zentrum Berlin für Materialien und Energie1,Freie Universität Berlin2,Oak Ridge National Laboratory3
Ferroelectric nanostructures are of great interest for fundamental studies on scaling effects of ferroelectricity and as building blocks for ferroelectric-based nanoscale devices for low power, high density integrated circuits. In this study, we investigate the ferroelectric properties of BaTiO<sub>3</sub> cylindrical nanostructures on Si. Epitaxial BaTiO<sub>3 </sub>thin films were grown by molecular beam epitaxy on SrTiO<sub>3</sub>-buffered Si (100) substrates Nanopillars with different lateral dimensions (from 200 - 500 nm) were then fabricated using focused neon ion milling in a Zeiss Orion Nanofab microscope<sup>1</sup>. The unpatterned thin films were first characterized using X-ray diffraction, Raman spectroscopy, and piezoresponse force microscopy (PFM) showing <i>c</i>- axis orientation and a ferroelectric behaviour. Ferroelectricity in the neon ion milled nanostructures was investigated using band excitation piezoresponse force microscopy (BE-PFM)<sup>2</sup> and contact Kelvin probe force microscopy (cKPFM)<sup>3</sup>. Their crystalline structure, strain state, and polarization were studied at a local scale by scanning/transmission electron microscopy (S/TEM). We find an imprint and a maximal switchable response in the nanostructures that are dependent on their lateral dimension. The information gained from S/TEM will be discussed, emphasizing the effect of the pillar lateral dimensions on the polarization state. Finally, the potential damage caused by the ions during milling will be evaluated.<br/><br/><b>References</b><br/>1. Olanyian, I. <i>et al.</i> Nanofabrication of barium titanate using noble gas ions, submitted 2022.<br/>2. Jesse, S., <i>et al.</i>, The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale. <i>Nanotechnology</i> <b>18</b>, 435503 (2007).<br/>3. Balke, N. <i>et al.</i> Differentiating Ferroelectric and Nonferroelectric Electromechanical Effects with Scanning Probe Microscopy. <i>ACS Nano</i> <b>9</b>, 6484–6492 (2015).

Keywords

focused ion beam (FIB) | scanning transmission electron microscopy (STEM)

Symposium Organizers

Ying-Hao Chu, National Tsing Hua University
Catherine Dubourdieu, Helmholtz-Zentrum Berlin / Freie Universität Berlin
Olga Ovchinnikova, Oak Ridge National Laboratory
Bhagwati Prasad, Indian Institute of Science

Symposium Support

Bronze
CRYOGENIC LIMITED

Publishing Alliance

MRS publishes with Springer Nature