MRS Meetings and Events

 

NM06.13.05 2022 MRS Fall Meeting

Photoresist-Free and Large-Area Patterning Method for van der Waals Materials via Direct Optical Lithography

When and Where

Dec 2, 2022
2:30pm - 2:45pm

Hynes, Level 2, Room 207

Presenter

Co-Author(s)

Seong Rae Cho1,Seonghun Ahn1,Seung Hyung Lee1,Heonhak Ha1,Tae Soo Kim1,Min-kyung Jo1,2,Chanwoo Song1,Tae Hong Im1,Pragya Rani1,Minseung Gyeon1,Kiwon Cho1,Seungwoo Song2,Min Seok Jang1,Yong-Hoon Cho1,Keon Jae Lee1,Kibum Kang1

Korea Advanced Institute of Science and Technology1,Korea Research Institute of Standards and Science2

Abstract

Seong Rae Cho1,Seonghun Ahn1,Seung Hyung Lee1,Heonhak Ha1,Tae Soo Kim1,Min-kyung Jo1,2,Chanwoo Song1,Tae Hong Im1,Pragya Rani1,Minseung Gyeon1,Kiwon Cho1,Seungwoo Song2,Min Seok Jang1,Yong-Hoon Cho1,Keon Jae Lee1,Kibum Kang1

Korea Advanced Institute of Science and Technology1,Korea Research Institute of Standards and Science2
Van der Waals (vdW) materials have attracted significant interest as new research platforms of next-era research since they exhibit novel properties with surface-dominant geometry. However, the properties of vdW materials are highly affected by the surface state of the materials owing to the geometrical feature of the materials and, therefore, the conventional photolithography technique accompanying undesired photoresist residues and solution process has negative effects on vdW materials. Several alternative patterning techniques have been reported to avoid the issue, but they suffer from low resolution, scalability, and low throughput.<br/>In this work, we report a new patterning technique, the direct optical lithography technique, specialized for vdW materials. The direct optical lithography uses highly intensive photo illumination in a short pulse with a special photomask to follow the advantage of conventional photolithography without photoresists and solvents. We patterned various vdW materials (monolayer MoS<sub>2</sub>, bilayer MoS<sub>2</sub>, monolayer graphene, monolayer WSe<sub>2</sub>, and two-dimensional metal-organic framework) in multiscale and desired shapes. Morphological characterization revealed that direct optical lithography did not cause photoresist residues unlike conventional photolithography and optical characterization exhibited critical differences between direct optical lithography and conventional photolithography. The finite element method (FEM) simulation results demonstrated that the photo source used in this work, the highly intensive light with a short pulse, was suitable for high-resolution patterning of vdW materials without degradation of patterned materials.

Keywords

laser ablation | laser decomposition | lithography (removal)

Symposium Organizers

Nicholas Glavin, Air Force Research Laboratory
Aida Ebrahimi, The Pennsylvania State University
SungWoo Nam, University of California, Irvine
Won Il Park, Hanyang University

Symposium Support

Bronze
MilliporeSigma

Publishing Alliance

MRS publishes with Springer Nature