MRS Meetings and Events

 

EQ04.01.01 2022 MRS Fall Meeting

Unexpected Phase-Pure Wurtzite Structure of Nitrogen Doped ZnSe1-xTex Thin Films

When and Where

Nov 28, 2022
10:30am - 10:45am

Sheraton, 2nd Floor, Constitution A

Presenter

Co-Author(s)

Sage Bauers1,Theodore Culman1,Rachel Woods-Robinson2,John Mangum1,Rebecca Smaha1,Chris Rom1,Andriy Zakutayev1

National Renewable Energy Laboratory1,Lawrence Berkeley National Laboratory2

Abstract

Sage Bauers1,Theodore Culman1,Rachel Woods-Robinson2,John Mangum1,Rebecca Smaha1,Chris Rom1,Andriy Zakutayev1

National Renewable Energy Laboratory1,Lawrence Berkeley National Laboratory2
Conventional II-VI and III-V compound semiconductors can be roughly split into two structural categories: zincblende and wurtzite. Both are tetrahedral systems and furthermore, their crystal structures are polytypes with only slight modification to the stacking pattern of honeycomb cation/anion planes. Controlling zincblende–wurtzite polytypism within a single material is a promising way to design semiconductor functionality. In this talk we show that nitrogen doping induces a zincblende-to-wurtzite structural transition in ZnSe<sub>1-x</sub>Te<sub>x</sub> when grown as sputter deposited thin films. N-doped ZnSe<sub>1-x</sub>Te<sub>x</sub> is prepared from ZnSe and ZnTe source targets with gaseous N<sub>2</sub> as a N source. In some doped films, there is a structural transformation from the usual zincblende to wurtzite. Depending on the temperature and N<sub>2</sub> flow rate during growth, wurtzite can be synthesized across most of the composition range explored, ranging from Te-rich (x ≈ 0.7) to nearly pure ZnSe (x ≈ 0.1). Grazing-incidence, wide-angle synchrotron x-ray scattering (GIWAXS) data show that the N-doped ZnSe<sub>0.5</sub>Te<sub>0.5</sub> alloy forms as phase-pure wurtzite. Temperature-dependent electronic transport measurements collected from N-doped ZnSe<sub>0.5</sub>Te<sub>0.5</sub> indicate the material is a p-type semiconductor and low-temperature resistivity data are well fit by a transport model dominated by 3D variable range hopping. Scanning electron microscopy reveals voids in the N-doped films that are not present in undoped films. We attribute these microstructural features to N<sub>2</sub> gas trapped during growth, which is confirmed by signals from molecular nitrogen in x-ray absorption spectroscopy data. 0 K formation enthalpy calculations do not completely describe the stability of the wurtzite phase, so we hypothesize that the open microstructure plays a role by increasing the surface energy contribution. This work highlights unexpected polytypism in one of the most studied II-VI semiconductor systems and thus motivates a closer look at other well-studied semiconductor alloys for similar structural diversity.

Keywords

combinatorial | II-VI | sputtering

Symposium Organizers

Rafael Jaramillo, Massachusetts Institute of Technology
Archana Raja, Lawrence Berkeley National Laboratory
Jayakanth Ravichandran, University of Southern California
Akshay Singh, Indian Institute of Science, Bengaluru

Symposium Support

Silver
SEMILAB

Bronze
Lake Shore Cryotronics
Micro Photonics
SPECS Surface Nano Analysis GmbH

Publishing Alliance

MRS publishes with Springer Nature