Please contact the symposium organizers with questions.

Focused ion-beam (FIB) based tools have become invaluable in materials science and engineering for their capabilities in micro-/nanofabrication, imaging and spectroscopy. Source types include Liquid Metal Ion Sources (LMIS), Gas Field Ionization Sources (GFIS), plasma ion sources and laser-cooled sources, offering an ever increasing choice of focused ion species for a wide range of applications. Modification of materials by direct-write nanofabrication using milling, deposition and implantation is employed extensively in both industry and academia. Novel in-situ combinatorial techniques present new routes for exploring and quantifying materials at the nanoscale, for example through coupling to Secondary Ion Mass Spectrometry (SIMS); and through correlative imaging using ion, electron, light and x-ray based techniques, culminating in truly interdisciplinary work. This symposium aims to provide a forum for exchange on a variety of emerging technologies and applications in this area.

A broad range of topics will be addressed, with particular focus on recent technological advancements, concepts for novel ion sources, frontiers in nanofabrication, direct-write atomic and chemical disordering, in-situ platforms (e.g. heating, environmental cells), in-situ multimodal analysis, slice-and-image tomography and correlative microscopy, advances in computational techniques for data analysis, and novel simulation codes. Reflecting the interdisciplinary nature of this field, results pertaining to a wide variety of materials, including 2D materials, semiconductors, superconductors, ferroelectric and magnetic materials, polymers, and biological samples will be presented and discussed.

Topics will include:

• Frontiers in nanofabrication
• Localized property engineering and irradiation effects
• FIB-based analytics: Correlative imaging and multimodal analysis
• FIB-based solutions for biological materials
• FIB applications in electronics
• In-situ FIB platforms
• Novel ion sources
• Computational techniques

• A tutorial complementing this symposium is tentatively planned.

Invited Speakers:

• Ed Bielejec (Sandia National Laboratories, USA)
• Rosa Córdoba (University of Valencia, Spain)
• Anne Delobbe (Orsay Physics, France)
• Jason Fowlkes (Oak Ridge National Laboratory, USA)
• Jacques Gierak (University of Paris-Saclay, France)
• Christelle Guillermier (Carl Zeiss, USA)
• Songkil Kim (Pusan National University, Republic of Korea)
• Lasse Kling (Helmholtz Zentrum Berlin for Materials and Energy, Germany)
• Arkady Krasheninnikov (Helmholtz-Zentrum Dresden-Rossendorf, Germany)
• Hao Li (University of California, Riverside, USA)
• Lane Martin (University of California, Berkeley, USA)
• Paul Mazarov (Raith, Germany)
• Johann Michler (Swiss Federal Laboratories for Materials Science and Technology, Switzerland)
• Olga Ovchinnikova (Oak Ridge National Laboratory, USA)
• Mike Phaneuf (Fibics Inc., Canada)
• Miroslava Schaffer (Max Planck Institute of Biochemistry, Germany)
• Keana Scott (National Institute of Standards and Technology, USA)
• Andrew Smith (Kleindiek, Germany)
• John Thong (National University of Singapore, Singapore)
• Tom Wirtz (Luxembourg Institute of Science and Technology, Luxembourg)
• Hongzhou Zhang (Trinity College Dublin, Ireland)

Symposium Organizers