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2013 MRS Spring Meeting & Exhibit

April 1-5, 2013 | San Francisco
Meeting Chairs: Mark L. Brongersma, Vladimir Matias, Rachel Segalman, Lonnie D. Shea, Heiji Watanabe

Symposium Y : Advances in Scanning Probe Microscopy for Imaging Functionality on the Nanoscale

2013-04-02   Show All Abstracts

Symposium Organizers

Stephen Jesse, Oak Ridge National Laboratory
H. Kumar Wickramasinghe, University of California, Irvine
Franz J. Giessibl, University of Regensburg
Ricardo Garcia, Instituto de Microelectronica de Madrid

Symposium Support

Asylum Research, an Oxford Instruments Company
SPECS Surface Nano Analysis GmbH
WITec Instruments Corp.
Y2:
Session Chairs
Franz J. Giessibl
Tuesday PM, April 02, 2013
Moscone West, Level 3, Room 3004

2:30 AM - *Y2.01
Clarifying Atomic Contrast of the TiO2(101) Anatase Surface by Means of Bimodal Atomic Force Microscopy/Spectroscopy and Simultaneous Scanning Tunneling Microscopy

Oscar Custance 1

1National Institute for Materials Science Tsukuba Japan

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3:00 AM - Y2.02
Scanning Probe Microscopy and Spectroscopy of Nanodiamonds under Illumination

Remy Pawlak 1 Thilo Glatzel 1 Shigeki Kawai 1 Sweetlana Fremy 1 Loic Schmidlin 2 Vincent Pichot 2 Denis Spitzer 2 Ernst Meyer 1

1Department of Physics Basel Switzerland2Nanomatamp;#233;riaux pour des Systamp;#232;mes Sous Sollicitations Extramp;#234;mes (NS3E) UMR 3208 ISL/CNRS Saint Louis France

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3:15 AM - Y2.03
Photo-kelvin Probe Force Microscopy for Photocatalytic Performance Characterization of Single Filament of TiO2 Nanofiber Photocatalysts

Ming-Chung Wu 1 Hseuh-Chung Liao 2 Yu-Cheng Cho 3 Geza Toth 4 Yang-Fang Chen 3 Wei-Fang Su 2 Krisztian Kordas 4

1Chang Gung University Tao-Yuan Taiwan2National Taiwan University Taipei Taiwan3National Taiwan University Taipei Taiwan4University of Oulu Oulu Finland

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3:30 AM - *Y2.04
Imaging and Directed Rotation of Single Molecules by Non-contact Force Microscopy

Ernst Meyer 1

1University of Basel 4056 Switzerland

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4:00 AM - Y2
Break

4:30 AM - *Y2.05
Investigation of the Mechanical Properties of a Monoatomic Layer by Combined STM and AFM Measurements

Markus Ternes 1 Tobias Herden 1 Klaus Kern 1

1MPI Stuttgart Stuttgart Germany

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5:00 AM - Y2.06
Incipient Plasticity and Pop-ins Studied by Depth-sensing Indentation Using Combined STM, AFM and FIM Techniques

William Paul 1 David J Oliver 1 Yoichi Miyahara 1 Peter Gruetter 1

1McGill University Montreal Canada

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5:15 AM - Y2.07
Directing Supramolecular Self-assembly by Using Charge Transfer at Metal-organic Interfaces

A. Della Pia 1 M. Riello 2 A. Floris 2 D. Stassen 3 T. S. Jones 1 D. Bonifazi 3 A. De Vita 2 G. Costantini 1

1University of Warwick Coventry United Kingdom2King's College London London United Kingdom3Universitamp;#233; de Namur Namur Belgium

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Y1:
Session Chairs
Franz J. Giessibl
Tuesday AM, April 02, 2013
Moscone West, Level 3, Room 3004

9:30 AM - *Y1.01
Bond-order Discrimination within Molecules by Atomic Force Microscopy

Leo Gross 1 Fabian Mohn 1 Bruno Schuler 1 Nikolaj Moll 1 Gerhard Meyer 1

1IBM Research - Zurich Rueschlikon Switzerland

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10:00 AM - Y1.02
Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy

Franz J. Giessibl 1 Joachim Welker 1

1University of Regensburg Regensburg Germany

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10:15 AM - *Y1.03
Dynamic Force Microscopy and Spectroscopy: New Approaches with Highly Defined Tips

Hendrik Hoelscher 1

1Karlsruhe Institute of Technology (KIT) Karlsruhe Germany

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10:45 AM - Y1
Break

11:30 AM - *Y1.05
In Situ Scanning Tunneling Microscopy Study of Perovskite Manganites

Zheng Gai 1

1Oak Ridge National Laboratory Oak Ridge USA

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12:00 PM - Y1.06
Direct Probing of Nano-dimensioned Oxide Multilayers at High Temperature by Scanning Tunneling Microscopy with Aid of Focused Ion Beam Milling

Yan Chen 1 Zhuhua Cai 1 Yener Kuru 1 2 Harry L. Tuller 2 Bilge Yildiz 1

1Massachusetts Institute of Technology Cambridge USA2Massachusetts Institute of Technology Cambridge USA

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12:15 PM - Y1.07
Reconstruction of Vicinal Pt(111) Surfaces Influenced by Step Orientations under High Pressures of Ethylene and CO

Zhongwei Zhu 1 2 Cedric Barroo 3 Baohua Mao 4 Zhi Liu 4 Thierry Visart de Bocarme 3 Norbert Kruse 3 Miquel Salmeron 2 5 Gabor A Somorjai 1 2

1University of California Berkeley USA2Lawrence Berkeley National Laboratory Berkeley USA3Universitamp;#233; Libre de Bruxelles Bruxelles Belgium4Lawrence Berkeley National Laboratory Berkeley USA5University of California Berkeley USA

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12:30 PM - Y1.08
Electrochemical Scanning Tunneling Microscopy of Pb-Cu Surface Alloy Formation

Dincer Gokcen 1 Thomas P. Moffat 1

1National Institute of Standards and Technology Gaithersburg USA

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12:45 PM - Y1.09
Manipulating Fermi Level of CuPc Molecules by Dosing Gaseous Oxidant

Jun Hong Park 1 Sang Wook Park 1 William C. Trogler 2 Andrew C. Kummel 2

1University of California San Diego La Jolla USA2University of California San Diego La Jolla USA

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2013-04-03   Show All Abstracts

Symposium Organizers

Stephen Jesse, Oak Ridge National Laboratory
H. Kumar Wickramasinghe, University of California, Irvine
Franz J. Giessibl, University of Regensburg
Ricardo Garcia, Instituto de Microelectronica de Madrid

Symposium Support

Asylum Research, an Oxford Instruments Company
SPECS Surface Nano Analysis GmbH
WITec Instruments Corp.
Y4:
Session Chairs
Stephen Jesse
Wednesday PM, April 03, 2013
Moscone West, Level 3, Room 3004

2:45 AM - *Y4.01
Molecular-scale 3D Visualization of Solid-liquid Interfaces by Frequency Modulation Atomic Force Microscopy

Hirofumi Yamada 1 Kei Kobayashi 1 Shinichiro Ido 1 Kenichi Umeda 1 Kazuhiro Suzuki 1

1Kyoto University Kyoto Japan

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3:15 AM - Y4.03
Towards Atomic Force Microscopy with Chemical Contrast

Yohei Toriyama 1 Denis Damiron 2 1 Othman Mohammad 1 Dai Kobayashi 1 Hideki Kawakatsu 1

1Institute of Industrial Science, the University of Tokyo Tokyo Japan2the University of Tokyo Tokyo Japan

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3:30 AM - Y4.04
Atomic Imaging of the Dual Sensing Mechanism of NO2 on Copper Phthalocyanine

Sang Wook Park 1 Jun Hong Park 1 Andrew Kummel 2

1University of California, San Diego La Jolla USA2University of California, San Diego La Jolla USA

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3:45 AM - Y4.05
AFM for Real Time Chemical Identification and Its Application in Lateral Force Microscopy

Denis Damiron 1 2 Yohei Toriyama 2 Mohammad Othman 2 Dai Kobayashi 2 Hideki Kawakatsu 2

1IIS, The University of Tokyo Tokyo Japan2The University of Tokyo Tokyo Japan

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4:00 AM - Y4
Break

4:30 AM - Y4.06
Improved Photothermal Induced Resonance Platform for Nanoscale Infrared Spectroscopy

Aaron M. Katzenmeyer 1 Vladimir Aksyuk 1 Andrea Centrone 1 2

1NIST Gaithersburg USA2University of Maryland College Park USA

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4:45 AM - Y4.07
Improved Atomic Force Microscope Infrared Spectroscopy for Rapid Nanometer-scale Chemical Imaging of a Polymer Blend

Hanna Cho 1 Jonathan R Felts 1 Min-Feng Yu 1 Lawrence A Bergman 2 Alexander F Vakakis 1 William P King 1

1University of Illinois at Urbana-Champaign Urbana USA2University of Illinois at Urbana-Champaign Urbana USA

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5:00 AM - Y4.08
AFM-MS: Nanoscale Mass Spectrometry Imaging with Heated AFM Probes

Olga S Ovchinnikova 1 Kevin Kjoller 2 Gary J. Van Berkel 1

1Oak Ridge National Laboratory Oak Ridge USA2Anasys Instruments Inc. Santa Barbara USA

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5:15 AM - Y4.09
Near-field Raman Spectroscopy for Chemical Imaging of Surfaces

Raphael Ramos 1 Alex Heilman 1 Michael Gordon 1

1UC Santa Barbara Santa Barbara USA

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5:30 AM - Y4.10
True Surface Microscopy: Confocal Raman Imaging Guided by Surface Topography

Wei Liu 1 Jianyong Yang 1 Olaf Hollricher 1

1WITec Instruments Corp Knoxville USA

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Y5: Poster Session
Session Chairs
Wednesday PM, April 03, 2013
Marriott Marquis, Yerba Buena Level, Salons 7-8-9

9:00 AM - Y5.01
Forces during the Controlled Displacement of PTCDA Molecules on a Ag(111) Surface Using Non-contact Atomic Force Microscopy

Andre Schirmeisen 1 Gernot Langewisch 2 Jens Falter 2 Harald Fuchs 2

1University of Giessen Giessen Germany2University of Muenster Muenster Germany

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9:00 AM - Y5.02
Applications of Electron Beam Induced Deposition on Atomic Force Microscopy

Chien-Ting Wu 1 Yen-Han Ku 2 Mei-Yi Li 4 Mao-Nan Chang 2 Po-Li Chen 3 Ming-Hua Shiao 3

1National Nano Device Laboratories Hsinchu Taiwan2National Chung Hsing University Taichung Taiwan3Instrument Technology Research Center Hsinchu Taiwan4National Chiao Tung University Hsinchu Taiwan

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9:00 AM - Y5.03
Interfacial Properties at the Gate Dielectric of Low-voltage CuPc Thin Film Transistor

Weiguang Xie 1 Yaorong Su 2 Jianbin Xu 2

1The Chinese University of Hong Kong Hong Kong Hong Kong2Jinan University Guangzhou China

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9:00 AM - Y5.04
Electric Characterization of Nanoscale Au/TiO2 Schottky Diodes Probed with Conductive Atomic Force Microscopy

Hyunsoo Lee 1 Van Trong Nghia 1 Jeong Young Park 1

1Nanocentury KI, KAIST Daejeon Republic of Korea

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9:00 AM - Y5.05
Scanning Tunneling Microscopy Studies of Janus Structures on Mixed Monolayer Coated Gold Nanoparticles

Quy K Ong 1 Miao Yu 1 Javier Reguera 1 Francesco Stellacci 1

1amp;#201;cole Polytechnique Famp;#233;damp;#233;rale de Lausanne Lausanne Switzerland

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9:00 AM - Y5.06
Polymerization of Monomolecular Films Containing Pyrrolyl Groups by Chemical Adsorption Technique

Shin-ichi Yamamoto 1 Kazufumi Ogawa 2

1Ryukoku University Otsu Japan2Kagawa University Takamatsu Japan

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9:00 AM - Y5.07
Variable Force Imaging in Oscillatory Atomic Force Microscopy Modes

Craig Wall 1 Sergei Magonov 1 Sergey Belikov 1 John Alexander 1

1NT-MDT Development Tempe USA

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9:00 AM - Y5.08
Luminescence and Molecular Electronics for Quantum Dot-pi; Conjugated Molecule Hybrids

Yoondeok Han 1 Yong-baek Lee 1 Sumin Jeon 2 Jeongyong Kim 3 Kwang-Sup Lee 2 Jinsoo Joo 1

1Korea University Seoul Republic of Korea2Hannam University Daejeon Republic of Korea3University of Incheon Incheon Republic of Korea

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9:00 AM - Y5.09
Magnetic Domain Structures of Nanocrystalline Zr18-xHfxCo82 Ribbons: Effect of Hf Doping

Lanping Yue 1 Wenyong Zhang 1 2 Imad Al-Omari 1 2 3 Ralph Skomski 1 2 David J Sellmyer 1 2

1University of Nebraska Lincoln USA2University of Nebraska Lincoln USA3Sultan Qaboos University Muscat Oman

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9:00 AM - Y5.10
Heat Transfer between a Self-heated Scanning Thermal Microscopy Probe and a Cold Sample: Impact of the Probe Temperature

Ali Assy 1 2 3 Severine Gomes 1 2 3 Stephane Lefevre 1 2 3 P-Olivier Chapuis 1 2 3

1Centre de Thermique de Lyon UMR 5008 Institut National des Sciences Appliquamp;#233;es de Lyon de Lyon Villeurbanne France2CNRS Villeurbanne France3Lyon University Villeurbanne France

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9:00 AM - Y5.11
Characterization of Polypropylene-based Graphene Nanocomposites Surface

Kjerstin Gronski 1 Robinson Flaig 1 Jorge Camacho 1 Yan Wu 1 James P. Hamilton 1

1UW-Platteville Platteville USA

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9:00 AM - Y5.12
Multimodal Dynamic Mode Liquid Atomic Force Microscopy

Hideki Kawakatsu 1 Hiroaki Murakami 1 Yohei Toriyama 1 Shuhei Nishida 1 Dai Kobayashi 1

1IIS Tokyo Japan

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9:00 AM - Y5.13
Full Diamond Probes as Enabler for 3D Metrology and Nano-machining

Thomas Hantschel 1 Menelaos Tsigkourakos 1 2 Daniel Simon 1 Andreas Schulze 1 2 Kristof Paredis 1 Pierre Eyben 1 Wilfried Vandervorst 1 2

1imec Leuven Belgium2KU Leuven Leuven Belgium

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9:00 AM - Y5.14
Force Distance Curves on Asphalt Binders: Probing Viscoelastic Materials

Renata Antoun Simao 1 Erico Rodrigues Dourado 2 1 Bianca Pizzorno 1

1UFRJ Rio de Janeiro Brazil2IFRJ - Instituto Federal de Educaamp;#231;amp;#227;o, Ciamp;#234;ncia e Tecnologia do Rio de Janeiro, Campus Volta Redonda Volta Redonda Brazil

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9:00 AM - Y5.15
Atomic Force Microscopy Based Methods to Study Mechanical Properties of Cellulose Fibers

Christian Ganser 1 2 Franz J. Schmied 1 2 3 Wolfgang Fischer 2 4 Robert Schennach 2 5 Christian Teichert 1 2

1Montanuniversitaet Leoben Leoben Austria2Graz University of Technology Graz Austria3Mondi Uncoated Fine amp; Kraft Paper GmbH Vienna Austria4Graz University of Technology Graz Austria5Graz University of Technology Graz Austria

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Y3:
Session Chairs
Leo Gross
Wednesday AM, April 03, 2013
Moscone West, Level 3, Room 3004

9:30 AM - Y3.01
Differentiated Photo-oxidation in Organic Photovoltaics

Guozheng Shao 1 Glennis Rayermann 1 Eric Smith 1 David Ginger 1

1University of Washington Seattle USA

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9:45 AM - *Y3.02
Time-resolved Photoelectric Force Microscopy for High Resolution Mapping of Recombination Centers in BiFeO3

Marin Alexe 1

1Max Planck Institute of Microstructure Physics Halle Germany

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10:15 AM - Y3.03
nc-AFM and KPFM Study of Model Donor-acceptor Self-assemblies for Organic Photovoltaics

Franz Fuchs 1 Christiaan J. F. de Vet 1 Renaud Demadrille 1 Mathieu Linares 2 Benjamin Grevin 1

1CEA-INAC-UMR5819 SPrAM (CEA-CNRS-UJF) Grenoble France2Linkoeping University Linkoeping Sweden

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10:45 AM - Y3
Break

11:15 AM - Y3.05
Mapping Local Charge Recombination Heterogeneity at 40 nm Resolution by Next Generation Scanning Near Field Optical Probe

Wei Bao 1 2 Mauro Melli 1 Niccolamp;#242; Caselli 3 4 Francesco Riboli 3 4 Diederik Wiersma 3 5 Matteo Staffaroni 6 Hyuck Choo 7 David Ogletree 1 Shaul Aloni 1 Jeffery Brokor 6 Stefano Cabrini 1 Francesca Intonti 3 Miquel Salmeron 1 2 Eli Yablonovitch 6 1 Peter James Schuck 1 Alexander Weber-Bargioni 1

1Lawrence Berkeley National Laboratory Berkeley USA2UC Berkeley Berkeley USA3European Laboratory for Non-linear Spectroscopy Sesto Fiorentino Italy4Universita` di Firenze Sesto Fiorentino Italy5Istituto Nazionale di Ottica Firenze Italy6UC Berkeley Berkeley USA7Caltech Pasadena USA

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11:30 AM - Y3.06
Investigation of Light Guidance in Thin-film Solar Cells by Two-probe Scanning Near-field Optical Microscopy

Stephan Lehnen 1 Ulrich Wilhelm Paetzold 1 Andre Hoffmann 1 Karsten Bittkau 1 Reinhard Carius 1

1Forschungszentrum Jamp;#252;lich Jamp;#252;lich Germany

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11:45 AM - Y3.07
Contrast and Resolution in Subsurface Near-field Microscopy

Benedikt Hauer 1 Andreas Peter Engelhardt 1 Thomas Taubner 1

1RWTH Aachen University Aachen Germany

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12:00 PM - Y3.08
Near-field Nanoscale Investigation of Optical Properties of Bi2Se3 and Bi2Te3 Thin-films

Sarah Elaine Grefe 1 Shahab Derakhshan 2 Yohannes Abate 1

1California State University Long Beach Long Beach USA2California State University Long Beach Long Beach USA

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12:15 PM - Y3.10
Integration of a-NSOM into an IR Beamline for IR Spectroscopy

Christoph Deneke 1 Raul Freitas 2 Thierry Moreno 3 Paul Dumas 3 Pedro Paulo 2 Regis Neuenschwander 2 Evandro Lanzoni 1 Harry Westfahl 2

1LNNano Campinas Brazil2LNLS Campinas Brazil3Sychrotron Soleil Gif-sur-Yvette France

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12:30 PM - Y3.111
Surface Enhanced Photothermal Induced Resonance (SE-PTIR): A New Method to Image near Field Hot Spots and Dark Plasmonic Modes

Basudev Lahiri 1 2 Glenn Holland 1 Vladimir Aksyuk 1 Andrea Centrone 1 2

1NIST Gaithersburg USA2University of Maryland College Park USA

Show Abstract

2013-04-04   Show All Abstracts

Symposium Organizers

Stephen Jesse, Oak Ridge National Laboratory
H. Kumar Wickramasinghe, University of California, Irvine
Franz J. Giessibl, University of Regensburg
Ricardo Garcia, Instituto de Microelectronica de Madrid

Symposium Support

Asylum Research, an Oxford Instruments Company
SPECS Surface Nano Analysis GmbH
WITec Instruments Corp.
Y7:
Session Chairs
Ricardo Garcia
Thursday PM, April 04, 2013
Moscone West, Level 3, Room 3004

2:30 AM - *Y7.01
Direct Write Polymer Patterning Using Heated AFM Tips

Armin W Knoll 1 Philip Paul 1 Felix Holzner 1 3 James L Hedrick 2 Michel Despont 1 Urs Duerig 1

1IBM Research - Zurich Rueschlikon Switzerland2IBM Research - Almaden San Jose USA3ETH Zurich Zurich Switzerland

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3:00 AM - Y7.02
AFM with Lorentz Contact Resonance for Nanoscale Thermal and Mechanical Analysis

Eoghan Dillon 1 Craig Prater 1 Kevin Kjoller 1 Roshan Shetty 1

1Anasys Instrumetns Santa Barbara USA

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3:15 AM - Y7.03
Thermomechanical Property Characterization with Dynamic AFM Methods

Jason P Killgore 1 Ryan C. Tung 1 Donna C. Hurley 1

1National Institute of Standards and Technology Boulder USA

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3:30 AM - Y7
Break

4:00 AM - *Y7.04
Determination of the Effective Young Modulus, Viscosity and Indentation by Bimodal FM-AFM

Elena T. Herruzo 1 Alma P. Perrino 1 Ricardo Garcia 1

1Instituto de Ciencia de Materiales de Madrid (ICMM-CSIC) Madrid Spain

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4:30 AM - Y7.05
Effects of Operating Conditions on Bimodal AFM: Simulations and Experiments

Ishita Chakraborty 1 Dalia G Yablon 1

1ExxonMobil Research and Engineering Annandale USA

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4:45 AM - Y7.06
Real-time Quantitative Determination of Dissipation and Elastic Properties of Material at the Nano-scale Using Dynamic Mode, Intermittent Contact Atomic Force Microscopy

Govind Saraswat 1 Pranav Agarwal 3 Greg Haugstad 2 Murti V. Salapaka 1

1University of Minnesota Minneapolis USA2University of MInnesota Minneapolis USA3GE Global Research Niskayuna USA

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5:00 AM - *Y7.07
Nanoscale Probing of Energy Conversion Processes in Environmentally Responsive Biomaterials

Ozgur Sahin 1

1Columbia University New York USA

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5:30 AM - Y7.08
Level Set Method on 5D Piezoresponse Force Microscopy Data Set for Exploring Ferroelectric Domain Wall Motion

Yunseok Kim 1 2 Stephen Jesse 1 Xiaoli Lu 3 4 Dietrich Hesse 3 Marin Alexe 3 Sergei Kalinin 1

1Oak Ridge National Laboratory Oak Ridge USA2Sungkyunkwan University Suwon Republic of Korea3Max Planck Institute of Microstructure Physics Halle (Saale) Germany4Xidian University Xi'an China

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5:45 AM - Y7.09
Reversible Nanoscale Switching of Polytwin Orientation in a Ferroelectric ThinFilm

Colm Durkan 1 J. A. Garcia-Melendrez 1

1University of Cambridge Cambridge United Kingdom

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Y6:
Session Chairs
Stephen Jesse
Thursday AM, April 04, 2013
Moscone West, Level 3, Room 3004

9:15 AM - Y6.01
AFM-based Tomography for Probing the Electrical Properties in Confined Volumes at the Nanometer Scale

Andreas Schulze 1 2 Thomas Hantschel 1 Pierre Eyben 1 Anne S. Verhulst 1 Rita Rooyackers 1 Anne Vandooren 1 Jay Mody 1 Wilfried Vandervorst 1 2

1imec Leuven Belgium2KU Leuven Leuven Belgium

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9:30 AM - Y6.02
Outwitting the Series Resistance in Scanning Spreading Resistance Microscopy

Andreas Schulze 1 2 Ruping Cao 1 Pierre Eyben 1 Thomas Hantschel 1 Wilfried Vandervorst 1 2

1imec Leuven Belgium2KU Leuven Leuven Belgium

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9:45 AM - Y6.03
Strain Effect on the Electronic Properties of Thiolated sub 10-nm-diameter Gold Nanocrystals as Determined by Scanning Probe Microscopy

Nicolas Clement 1 Simon Desbief 1 Kacem Smaali 1 Gilles Patriarche 1 Dominique Vuillaume 1 Philippe Leclere 2

1IEMN - CNRS Villeneuve d'Asq France2University of Mons Mons Belgium

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10:00 AM - Y6.04
Electrical Property Measurements on Organic Semiconductor Grains Using Point-contact Current Imaging Atomic Force Microscopy

Tomoharu Kimura 1 Kei Kobayashi 2 Hirofumi Yamada 1

1Kyoto University Kyoto Japan2Kyoto University Kyoto Japan

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10:15 AM - Y6.05
Measuring van der Waals Interactions at Metal-organic Interfaces at the Single-molecule Level Using a Conducting Atomic Force Microscope

Sriharsha V Aradhya 1 Michael Frei 1 Mark S Hybertsen 2 Latha Venkataraman 1

1Columbia University New York USA2Brookhaven National Laboratories Upton USA

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10:30 AM - Y6.06
Conductivity Measurement of Individual SnS Nanoparticles by Peak Force AFM

Caterina Prastani 1 Aliaksei Vetushka 2 Antonin Fejfar 2 Diana Nanu 3 Marius Nanu 3 Ruud Schropp 1 Jatin Rath 1

1Utrecht University Eindhoven Netherlands2Academy of Sciences of the Czech Republic Prague Czech Republic3Thin Film Factory Leeuwarden Netherlands

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10:45 AM - Y6
Break

11:15 AM - Y6.07
High Resolution Magnetic Force Microscopy Based on Switching Tip Magnetization

Vladimir Cambel 1 Marian Precner 1 Jan Fedor 1 Jan Soltys 1 Jaroslav Tobik 1 Goran Karapetrov 1 2

1Institute of Electrical Engineering, SAS Bratislava Slovakia2Drexel University Philadelphia USA

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11:30 AM - *Y6.08
Electrical Characterization in Aqueous Environments by Multidimensional Kelvin Probe Force Microscopy

Brian Rodriguez 1 2

1University College Dublin Dublin Ireland2University College Dublin Dublin Ireland

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12:00 PM - Y6.09
Quantitative Analysis of Local Electric Properties in Atomic Force Microscopy Modes

Craig Wall 1 Sergei Magonov 1 Sergey Belikov 1 John Alexander 1

1NT-MDT Development Tempe USA

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12:15 PM - Y6.10
Imaging Thin Films by Scanning Probe Microscopy and Artificial Neural Networks

Sacha Gomez 1 Elena Castellano-Hernandez 1 Juan Jose Saenz 2 Pablo Varona 1 Francisco de Borja Rodriguez 1 Eduardo Serrano 1 Cristina Gomez-Navarro 2 Julio Gomez-Herrero 2

1Universidad Autamp;#243;noma de Madrid Madrid Spain2Universidad Autamp;#243;noma de Madrid Madrid Spain

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12:30 PM - Y6.11
Surface Potential Mapping in Any Environment - The Multi Frequency Approach

Stefan A. L. Weber 1 2 Liam Collins 2 Jason I. Kilpatrick 2 Suzi P. Jarvis 2 Brian J. Rodriguez 2

1Max Planck Institute for Polymer Research Mainz Germany2University College Dublin Dublin Ireland

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12:45 PM - Y6.12
Imaging Electrical Conductivity of Nanomaterials Using Contactless Scanning Dielectric Force Microscopy (DFM)

Liwei Chen 1 Wei Lu 1 Jie Zhang 1 Yize Li 1

1Suzhou Institute of Nanotech and Nanobionics, CAS Suzhou China

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2013-04-05   Show All Abstracts

Symposium Organizers

Stephen Jesse, Oak Ridge National Laboratory
H. Kumar Wickramasinghe, University of California, Irvine
Franz J. Giessibl, University of Regensburg
Ricardo Garcia, Instituto de Microelectronica de Madrid

Symposium Support

Asylum Research, an Oxford Instruments Company
SPECS Surface Nano Analysis GmbH
WITec Instruments Corp.
Y8:
Session Chairs
Stephen Jesse
Brian Rodriguez
Friday AM, April 05, 2013
Moscone West, Level 3, Room 3004

9:45 AM - Y8.01
Spatially Resolved Mapping of Hysteretic Behavior during Mechanical Writing in Ferroelectrics

Amit Kumar 1 Yaser Bastani 2 Roger Proksch 3 Stephen Jesse 1 Nazanin Bassiri-Gharb 2 4 Sergei Kalinin 1

1Oak Ridge National Lab Oak Ridge USA2Georgia Institute of Technology Atlanta USA3Asylum Research Santa Barbara USA4Georgia Institute of Technology Atlanta USA

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10:00 AM - Y8.03
Probing Nano Mechanical Response of the Ferromagnetic Shape Memory Alloy Ni-Mn-Ga by Means of Contact Resonance Atomic Force Microscopy (CR-AFM)

Alexander Malwin Jakob 1 2 Stefan Georg Mayr 1 2 3

1University of Leipzig Leipzig Germany2Leibniz Institute of Surface Modification (IOM) Leipzig Germany3University of Leipzig Leipzig Germany

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10:15 AM - Y8.04
Surface Properties of Elastomeric Polypropylene Studied with Enhanced Atomic Force Microscopy Methods

Agnieszka Voss 1 Christian Dietz 1 Robert W. Stark 1

1Center of Smart Interfaces and Department of Materials Sciences, Technische Universitaet Darmstadt Darmstadt Germany

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10:30 AM - Y8.05
Combining In situ Nanotribology and Atomistic Simulations to Reveal the Strong Effect of Atomic-scale Roughness on Nanoscale Adhesion

Tevis D. B. Jacobs 1 Kathleen E. Ryan 2 Pamela L. Keating 2 David S. Grierson 3 Joel A. Lefever 1 Kevin T. Turner 4 Judith A. Harrison 2 Robert W. Carpick 4

1University of Pennsylvania Philadelphia USA2United States Naval Academy Annapolis USA3systeMECH, LLC Madison USA4University of Pennsylvania Philadelphia USA

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10:45 AM - Y8
Break

11:00 AM - Y8.06
Encased Cantilevers and Sensor Based Image Creation for Ultra-gentle High Speed Atomic Force Microscopy in Liquid

Dominik Ziegler 1 Travis Meyer 2 Alex Chen 2 Rodrigo Farmham 3 Nen Mai Huynh 3 Jen Mai Chang 3 Andrea Bertozzi 2 Paul Ashby 1

1Lawrence Berkeley National Laboratory Berkeley USA2UCLA Los Angeles USA3CSULB Long Beach USA

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11:15 AM - Y8.07
A Novel Scanning-probe Technique for Mechanical-properties Mapping

Jennifer L. Hay 1 Warren C. Oliver 2

1Agilent Technologies Oak Ridge USA2Nanomechanics, Inc. Oak Ridge USA

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11:30 AM - Y8.08
Self-sensing Atomic Force Microscopy Cantilevers Based on Tunnel Magnetoresistance Sensors

Ali Tavassolizadeh 1 Tobias Meier 2 Karsten Rott 3 Guenter Reiss 3 Eckhard Quandt 1 Hendrik Hoelscher 2 Dirk Meyners 1

1Christian-Albrechts-Universitamp;#228;t zu Kiel Kiel Germany2Karlsruhe Institute of Technology Karlsruhe Germany3Bielefeld University Bielefeld Germany

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11:45 AM - Y8.09
High Resolution MFM Imaging with EBID Designed Co Probes

Lyubov Belova 1 Olav Hellwig 2 Elizabeth Dobisz 2 E. Dan Dahlberg 3

1Royal Institute of Technology - KTH Stockholm Sweden2Hitachi Global Storage Technologies San Jose USA3University of Minnesota Minneapolis USA

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12:00 PM - Y8.10
Nanonis Control System and KolibriSensor: New Milestones in Scanning Probe Microscopy

Alessandro Pioda 1 Andreas Thissen 1

1SPECS Surface Nano Analysis GmbH Berlin Germany

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12:15 PM - Y8.11
A UHV Transmission Electron Microscope with an All-optic Atomic Force Microscope

Hideki Kawakatsu 1 Yohei Toriyama 1 Ken Nakano 1 HiIdenobu Nishizawa 1 Dai Kobayashi 1 Shun Takeda 1 Mohammad Othman 1

1IIS Tokyo Japan

Show Abstract