Lambert Alff

Presentation History

2024 MRS Spring Meeting

Bridging Thin Films Growth and Advanced Electron Microscopy to Uncover Structure-Property Correlations in Oxide Electronics

Apr 26, 2024, 2:30 PM

2024 MRS Spring Meeting

Unveiling Texture Transfer in Dielectric Thin Films via In Situ Electron Microscopy

Apr 23, 2024, 2:45 PM

2023 MRS Spring Meeting

Impact of Grain Boundary Atomic Structure on the Formation of Conductive Pathways in Memristive Devices

Apr 11, 2023, 5:00 PM

2022 MRS Fall Meeting

Spatially Resolved Electrical Analysis of Epitaxial Defect-Stabilized Hafnium Oxide Thin Films

Nov 28, 2022, 4:00 PM

2022 MRS Spring Meeting

Novel FIB-Based Fabrication Routine of Operative Oxide-Based Devices for In Situ/Operando TEM

May 10, 2022, 11:00 AM

2022 MRS Spring Meeting

In Situ TEM Studies of Resistive Switching in HfO₂ Based Memristors

May 10, 2022, 9:00 AM

2021 MRS Spring Meeting

Insights on Structure-Property Correlations in Hafnia-Based RRAM Devices by In Situ TEM

Apr 18, 2021, 8:00 AM

2019 MRS Fall Meeting

Temperature Dependent Study of Microstructure Evolution in HfO₂ Based Memristive Devices

Dec 4, 2019, 11:45 AM

2019 MRS Fall Meeting

Atomic and Electronic Structures of a SrMoO₃-Based All-Oxide Epitaxial Ferroelectric Varactor Tunable at Low Voltages

Dec 4, 2019, 11:30 AM

2019 MRS Spring Meeting

Reliable Integrated HfO₂ RRAM—Material Insights and Filaments Confinement

Apr 24, 2019, 8:30 AM