Symposium TC4-Advances in Spatial, Energy and Time Resolution in Electron Microscopy

The last few years have seen dramatic advances in electron microscope resolution, spatial resolution through aberration correction, energy resolution through monochromation, and time resolution through pulsed sources. New windows are opening into structure / property relations in thin films and nanosystems, and materials dynamics during phase changes and under operating environments. Increasingly large datasets are being generated through pixelated detectors and focal series and new methods of image analysis are becoming increasingly important. This symposium will survey these new emerging frontiers that modern microscopes are now able to explore.

• Applications of meV energy resolution
• Ultrafast imaging of dynamical processes
• Imaging electric fields and magnetism at the atomic level
• Applications of image analytics, statistics and compression
• Materials dynamics, including clusters, nanoparticles and nanowires
• High precision measurement of atomic positions for mapping strain, polarization, octahedral tilts
• In-situ and in-operando imaging of catalyst, battery, and fuel cell materials
• Nucleation and crystal growth from solutions, melts and vapors
• Functional imaging: electron beam induced current, cathodoluminescence

• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_0 (Institute of Materials Research and Engineering, Singapore)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_1 (Arizona State University, USA)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_2 (Pacific Northwest National Laboratory, USA)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_3 (University of Minnesota, USA)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_4 (Institute of Materials Science, Barcelona, Spain)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_5 (Haldor Topsoe A/S, USA)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_6 (University of Tokyo, Japan)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_7 (Sandia National Laboratories, USA)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_8 (Oak Ridge National Laboratory, USA)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_9 (CNRS/University Paris Sud, France)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_10 (Pacific Northwest National Laboratory, USA)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_11 (University of Vienna, Germany)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_12 (University of Toronto / MPI (Hamburg), Canada)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_13 (National University of Singapore, Singapore)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_14 (University of Oxford, United Kingdom)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_15 (Oak Ridge National Laboratory, USA)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_16 (IBM, USA)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_17 (FHI Berlin / MPI Energy Muehlheim, Germany)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_18 (National Institute of Standards and Technology, USA)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_19 (University of Tokyo, Japan)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_20 (Southeast University, China)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_21 (University of Antwerp, Belgium)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_22 (Universidad Complutense de Madrid, Spain)
• TC4_Advances in Spatial, Energy and Time Resolution in Electron Microscopy_23 (University of Wisconsin, USA)