Symposium UU-Frontiers in Scanning Probe Microscopy

Scanning Probe Microscopy (SPM) is one of the major tools responsible for the emergence of Nanotechnology. For the last years, we have witnessed a further proliferation of SPM in many areas of research: SPM helps solving various materials challenges in the fields of energy harvesting, semiconductor processing, sensors, self-assembly, biotechnology, and life sciences. Also, medical applications are on the horizon. The number of advanced SPM techniques that become commercially available these days keeps growing extremely fast. Many recent results are exciting and generally accepted but some are treated as controversial yet.

The main objective of this symposium is to gather leading SPM researchers to discuss the potential of novel SPM techniques, and to promote and discuss existing SPM methods applied to solve new problems. To attain this objective, a broad discussion of experts in different areas of material sciences and engineering, biophysics, condensed matter, and instrumentation development is needed. It is expected that the interdisciplinary nature of this symposium will attract strong participation from both academia and industry in the multidisciplinary environment of MRS meetings.

The series of symposiums on SPM techniques organized within the framework of the MRS over the last decade has been extremely successful in bringing together international leaders in both academia and industry, and attracting great interest of young researchers and students.

• Novel developments in SPM techniques: theory, instrumentation and applications, including high speed, high-resolution, SICM, multifrequency, tip enhanced optical techniques, SNOM, Microwave (SMM), etc.
• SPM applications inelectronic devices (metals, semiconductors and organic electronics)
• SPM applications inenergy applications
• SPM applications inpolymers, biophysics, medicine
• Mechanics at thenanoscale, force measurements
• Chemical identificationof atoms and molecules, including nano and bio-sensors

• UU_Frontiers in Scanning Probe Microscopy _0 (Instituto de Ciencia de Materiales de Madrid, Spain)
• UU_Frontiers in Scanning Probe Microscopy _1 (University of Regensburg, Germany)
• UU_Frontiers in Scanning Probe Microscopy _2 (University of California, Los Angeles, USA)
• UU_Frontiers in Scanning Probe Microscopy _3 (IBM, Switzerland)
• UU_Frontiers in Scanning Probe Microscopy _4 (Oak Ridge National Laboratory, USA)
• UU_Frontiers in Scanning Probe Microscopy _5 (Osaka University, Japan)
• UU_Frontiers in Scanning Probe Microscopy _6 (University of Waterloo, Canada)
• UU_Frontiers in Scanning Probe Microscopy _7 (University of Bristol, United Kingdom)
• UU_Frontiers in Scanning Probe Microscopy _8 (University of Rochester, USA)
• UU_Frontiers in Scanning Probe Microscopy _9 (Pohang University of Science and Technology, Republic of Korea)
• UU_Frontiers in Scanning Probe Microscopy _10 (University of Toronto, Canada)
• UU_Frontiers in Scanning Probe Microscopy _11 (University of Bielefeld, Germany)
• UU_Frontiers in Scanning Probe Microscopy _12 (University of Giessen, Germany)