April 7 - 11, 2025
Seattle, Washington
Symposium Supporters
2025 MRS Spring Meeting & Exhibit
SF01.14.23

High-Temperature Nonreciprocal Thermal Radiative Properties of Semiconductors

When and Where

Apr 10, 2025
5:00pm - 7:00pm
Summit, Level 2, Flex Hall C

Presenter(s)

Co-Author(s)

Bo Zhao1,Bardia Nabavi1

University of Houston1

Abstract

Bo Zhao1,Bardia Nabavi1

University of Houston1
Objects around us constantly emit and absorb thermal radiation. The basic properties that characterize these two processes are emissivity and absorptivity, respectively. For reciprocal systems, the emissivity and absorptivity for a given direction, polarization, and frequency are tightly restricted to be equal by Kirchhoff's law of thermal radiation (1-3). Recent research has shown that materials with magneto-optical effects such as doped InAs in the presence of an external magnetic field can break Kirchhoff's law, yielding nonreciprocal thermal radiation (4-5). Despite early experimental efforts (6-7) for nonreciprocal thermal radiation, it remains a challenge to measure nonreciprocal thermal emission, especially for samples with large areas on the order of several cm2 and high temperatures where band structure parameters and lattice structure alter. A theoretical model is also lacking to simulate the behavior of magneto-optical materials at elevated temperatures. Here we propose an emissometry setup that incorporates a magnetic assembly for nonreciprocal thermal emission measurement not only for large scale samples but also for temperatures as high as 1000 °C. A modified temperature-dependent Drude model is proposed to predict the radiative properties of semiconductors at high temperatures. Since the optical properties of these materials are highly temperature sensitive, our efforts provide effective experimental and theoretical platforms for high-temperature nonreciprocal thermal radiation study.


References
1. G. Kirchhoff, Annalen Der Physik, Vol. 185, (1860), p. 275.
2. L. Zhu and S. Fan, Phys. Rev. B, Vol, 90, (2014), 220301
3. B. Zhao, Y. Shi, J. Wang, Z. Zhao, N. Zhao, and S. Fan, Opt. Lett., Vol. 44, (2019), p.17
4. B. Zhao, C. Guo, C. A. C. Garcia, P. Narang, and S. Fan, Nano Lett., Vol. 20, (2020), p. 1923.
5. Y. Tsurimaki, X. Qian, S. Pajovic, F. Han, M. Li, and G. Chen, Phys. Rev. B, Vol. 101, (2020), p.165426.
6. Komron J. Shayegan et al, Sci. Adv. Vol. 8, (2022), p. 4308.
7. Komron J. Shayegan, S. Biswas, B. Zhao, Nat. Photon., Vol. 17, (2023), p. 891.

Keywords

metrology

Symposium Organizers

Yee Kan Koh, National University of Singapore
Zhiting Tian, Cornell University
Tianli Feng, University of Utah
Hyejin Jang, Seoul National University

Session Chairs

Zhiting Tian
Qiye Zheng

In this Session