Using Electron Ptychography as a “Computational Lens” to Push Resolution in 2D Materials

Developments in direct electron detectors and algorithms for image reconstruction have formed a new generation of “computational lenses.” Using a computational lens approach, we can extract phase information and reconstruct images that go beyond the resolution of aberration-corrected electron microscopes. This work can be extended to uncovering new physics in topological condensed matter systems and provide accessible sub-angstrom resolution imaging capabilities for institutions that lack the funding or facility to host expensive, sensitive equipment.