April 7 - 11, 2025
Seattle, Washington
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EN05.09.04

Isovalent Alkali Metal Doping as Shallow Complex Acceptors in Monovalent Copper (I) Based Semiconductors

When and Where

Apr 10, 2025
11:00am - 11:15am
Summit, Level 3, Room 330

Presenter(s)

Co-Author(s)

Kosuke Matsuzaki1,Chen-Wei Chang2,Yalun Tang2,Teruya Nagafuji3,Naoki Tsunoda3,Yu Kumagai4,Kenji Nomura2,Fumiyasu Oba3,Hideo Hosono3,5

National Institute of Advanced Industrial Science and Technology1,University of California, San Diego2,Tokyo Institute of Technology3,Tohoku University4,National Institute for Materials Science5

Abstract

Kosuke Matsuzaki1,Chen-Wei Chang2,Yalun Tang2,Teruya Nagafuji3,Naoki Tsunoda3,Yu Kumagai4,Kenji Nomura2,Fumiyasu Oba3,Hideo Hosono3,5

National Institute of Advanced Industrial Science and Technology1,University of California, San Diego2,Tokyo Institute of Technology3,Tohoku University4,National Institute for Materials Science5
The cation-deficient Cu(I)-based semiconductors show the greatest potential in photovoltaic devices that require p-type doping technology for tuning the key device parameters. Such doping can enhance the solar cell performance by reducing nonohmic contacts and series resistance and increasing the open-circuit voltages related to the built-in potential of the heterojunction devices. Notable examples include p-type Cu(In,Ga)Se2 and Cu2O photoabsorbers, which are known to improve solar cell efficiency by the substantial increase in hole concentration with alkali metal dopants (e.g. Na) [1, 2], though the mechanism behind the improvement remains unclear. Similarly, p-type doping is pivotal for the high-performance hole transport materials (HTM) for perovskite/organic solar cells, enhancing charge extraction to the external electrodes, ensuring high-workfunction ohmic contacts, and adjusting the Fermi level position to the absorbers. Wide-gap p-type Cu(I)-based semiconductors, such as γ-CuI are investigated for their potential for long-term stability as replacements for conventional organic HTMs. However, to date, device performance improvements have been limited, making extrinsic carrier doping an important step for the development of Cu(I)-based HTMs.
This paper elucidates the p-type doping mechanism in Cu2O with isovalent Na impurity, opening up a potential route for p-type doping in other Cu(I)-based semiconductors. First-principles calculations suggest Na interacts with the abundant native VCu defect in Cu2O to form the dopant–vacancy (Nai–2VCu) complex, which acts as a shallow acceptor with a lower formation energy than VCu [3]. Coulomb repulsion between the impurity and neighboring Cu cations reduces the formation energy of the acceptor-type VCu, increasing the net hole concentration. Based on this doping approach, we demonstrate γ-CuI with the Cs impurity distinctly improves the carrier concentration controllability for single crystals and thin films in the range 1013–1019 cm–3. First-principles calculations indicate that dopant–vacancy complexes (i.e., Csi–3VCu–VI and Csi–4VCu–VI) could be the origin of increased p-type conductivity, broadening the applicability of isovalent impurity doping in Cu(I)-based semiconductors [3].
Building on this scheme, we found that the variation in the impurity sizes of alkali metals enables both p- and n-type doping when the host material is within the doping limits. Such ambipolar control was attained in Cu3N polycrystalline thin films. The largest Cs enables p-type conductivity by forming (CsN–6VCu) acceptor complex, while the smallest Li facilitates n-type conductivity originating from a simple interstitial impurity (Lii) donor [4].
In summary, we propose a novel route for p-type doping in binary Cu(I)-based semiconductors, such as Cu2O, CuI and Cu3N, via the formation of impurity–defect complexes through the interaction between VCu and alkali metal impurities. This study presents an effective strategy for overcoming doping bottlenecks in Cu(I)-based semiconductors for use in optoelectronic devices.
[1] F. Pianezzi et al., Phys. Chem. Chem. Phys. 16, 8843 (2014).
[2] T. Minami et al., Appl. Phys. Lett. 105, 212104 (2014).
[3] K. Matsuzaki et al., J. Am. Chem. Soc. 144, 16572 (2022).
[4] K. Matsuzaki et al., J. Am. Chem. Soc. 146, 24630 (2024).

Keywords

Cu | electrical properties

Symposium Organizers

Heayoung Yoon, University of Utah
Edgardo Saucedo, Universitat Politècnica de Catalunya
Hao Xin, Nanjing University of Posts and Telecommunications
Eric Colegrove, National Renewable Energy Laboratory

Session Chairs

Eric Colegrove
Mirjana Dimitrievska

In this Session