The Applications of Operando X-Ray Fluorescence Microscopy in Electrochemical Systems

X-ray Fluorescence Microscopy (XFM) has been an invaluable tool for investigating the elemental composition of specimens in both 2D and 3D contexts. Its versatile application spans across various scientific domains, including biology, medicine, and environmental science. Recently, operando XFM has emerged as a powerful technique for monitoring the transition element dissolution and redeposition in electrochemical systems. This method enables us to measure both the projective 2D elemental distribution and the interfacial elemental distribution through in-situ and operando XFM approaches [1,2].<br/><br/>The Advanced Photon Source (APS) 2-ID-D/E beamlines are the state-of-the-art hard X-ray microprobe XFM beamlines. In this presentation, I will provide an overview of the current instrumentations at 2-ID beamlines, followed by a selection of compelling showcase applications. To conclude, I will explore future perspectives in post-APS-U in-situ/operando research with multiscale and multimodal approaches.<br/><br/>1. Hu, Anyang, Yuxin Zhang, Fan Yang, Sooyeon Hwang, Sami Sainio, Dennis Nordlund, N Evan Maxey, Luxi Li, et al. "Manipulating Interfacial Dissolution-Redeposition Dynamics to Resynthesize Electrode Surface Chemistry." ACS Energy Letters 7, 2588 (2022).<br/>2. Yuxin Zhang, Anyang Hu, Evan Maxey, Luxi Li, Feng Lin, “Spatiotemporal visualization and chemical identification of the metal diffusion layer at the electrochemical interface” J. Electrochem. Soc. 169, 100512 (2023).