April 22 - 26, 2024
Seattle, Washington
May 7 - 9, 2024 (Virtual)
Symposium Supporters
2024 MRS Spring Meeting
CH03.09.03

Kinetics Governed by Elastic Bias in In-Situ Electron Irradiated Aluminium: A Coupled Experimental and Modeling Study

When and Where

Apr 26, 2024
9:30am - 9:45am
Room 441, Level 4, Summit

Presenter(s)

Co-Author(s)

Estelle Meslin1,Camille Jacquelin1,Thomas Jourdan1,Maylise Nastar1,Chu Chun Fu1

CEA Saclay1

Abstract

Estelle Meslin1,Camille Jacquelin1,Thomas Jourdan1,Maylise Nastar1,Chu Chun Fu1

CEA Saclay1
In this study, we investigate the direct in-situ formation of nanometer-scale radiation damage, including voids and loops, using a High-Resolution Transmission Electron Microscope (HRTEM). We observe a size-dependent effect on the shape of cavities induced by electron irradiation, with non-truncated and cross shapes appearing at sizes below 2 nm, while larger sizes exhibit truncated shapes, consistent with DFT based-equilibrium shapes. This effect is explained by our multi-scale modelling, considering the effects of finite size and network discretization on void shapes. The observed dispersion in cavity shape during their growth and shrinkage is primarily influenced by magic numbers, determined by geometry and network frustration. Additionally, not only the voids but also loops were followed in-situ. Loops grow until they eliminate at the surface, while voids go through periodic growth and shrinkage. We demonstrate that the evolution of both objects is linked and governed by elastic bias. The unexpected void shrinkage is attributed to the change of the main sink for the elimination of interstitials. Void growth occurs when the main sinks for interstitials are the strongly biased dislocation loops, generating a stronger vacancy flux towards voids. Conversely, cavity shrinkage occurs when the loops are absent, and the main sinks for interstitials are the foil surface, generating a stronger interstitials flux towards voids.<br/>We reproduce accurately this phenomenon through Object-Kinetic Monte Carlo (OKMC) modelling.

Keywords

Al | radiation effects | transmission electron microscopy (TEM)

Symposium Organizers

Aurelie Gentils, Universite Paris-Saclay
Mercedes Hernandez Mayoral, CIEMAT
Djamel Kaoumi, North Carolina State University
Ryan Schoell, Sandia National Laboratories

Session Chairs

Aurelie Gentils
Mercedes Hernandez Mayoral

In this Session