Dec 3, 2024
8:00pm - 10:00pm
Hynes, Level 1, Hall A
Jean-Philippe Monchoux1,Camille Thenot1,Daniel Monceau1,Damien Connétable1,Pierre Sallot2,Marie-Amandine Pinault-Thaury3
Université de Toulouse1,Safran Tech2,GEMaC, CNRS, Université Paris-Saclay3
Jean-Philippe Monchoux1,Camille Thenot1,Daniel Monceau1,Damien Connétable1,Pierre Sallot2,Marie-Amandine Pinault-Thaury3
Université de Toulouse1,Safran Tech2,GEMaC, CNRS, Université Paris-Saclay3
First reliable experimental oxygen diffusion coefficient data have been obtained in a Ti<sub>48.3</sub>Al<sub>47.7</sub>Cr<sub>1.9</sub>Nb<sub>2.1</sub> near-γ GE alloy through secondary ion mass spectrometry (SIMS) depth profiling measurements of <sup>18</sup>O isotopes between 500°C and 700°C. The following expression of diffusion coefficient <i>D</i> has thus been derived: D(m<sup>2</sup>/s) = 10<sup>-10.6 ± 1</sup> exp(-107 ± 10 kJ.mol<sup>-1</sup>/RT). These data have been compared with theoretical calculations from literature, showing reasonable agreement concerning the activation energy, but significant discrepancy regarding the <i>D</i> values.