April 10 - 14, 2023
San Francisco, California
2023 MRS Spring Meeting
NM04.03.06
Atomic-Scale Observation of Few-Layers MoSSe Devices for Biasing via In Situ Transmission Electron Microscope
When and Where
Apr 12, 2023
10:45am - 11:00am
10:45am - 11:00am
InterContinental, Fifth Floor, Ballroom B
Presenter(s)
Co-Author(s)
Hsin-Ya Sung1,Yu-Lun Chueh2,Wen Wei Wu1
National Yang Ming Chiao Tung University1,National Tsing Hua University2
Keywords
in situ | scanning transmission electron microscopy (STEM) | transmission electron microscopy (TEM)
Symposium Organizers
Fatemeh Ahmadpoor, New Jersey Institute of Technology
Wenpei Gao, North Carolina State University
Mohammad Naraghi, Texas A&M University
Chenglin Wu, Missouri University of Science and Technology
Session Chairs
Fatemeh Ahmadpoor
Mohammad Naraghi