Atomic-Scale Structural Investigation on p-Type Copper Bismuthate for Photocathodes: Insights into Charge Hopping Conduction and Correlation with Crystal Defects Structure

Nov 29, 2023
8:00pm - 10:00pm

Hynes, Level 1, Hall A

Younghwan Lim¹,Hyun Joon Jung¹,Sung-Yoon Chung¹

Korea Advanced Institute of Science and Technology¹

defects | electrical properties | scanning transmission electron microscopy (STEM)

Craig Brown, National Institute of Standards and Technology

Michelle Dolgos, University of Calgary

Rie Makiura, Osaka Metropolitan University

Brent Melot, University of Southern California

Bronze
Anton Paar
Hiden Analytical Inc

Craig Brown

Brent Melot