Atom Probe Tomography for Semiconducting Materials for Microelectronics and Optoelectronics Applications

Nov 27, 2023
3:15pm - 3:45pm

Sheraton, Third Floor, Dalton

Yimeng Chen

Ty Prosa

Robert Ulfig

David Larson

Katherine Rice¹,Yimeng Chen¹,Isabelle Martin¹,Ty Prosa¹,Robert Ulfig¹,David Reinhard¹,David Larson¹

CAMECA¹

atom probe microscopy | atom probe tomography

David Diercks, Colorado School of Mines

Baishakhi Mazumder, University at Buffalo, The State University of New York

Frederick Meisenkothen, National Institute of Standards and Technology

Pritesh Parikh, Eurofins Nanolab Technologies

Bronze
CAMECA

Baishakhi Mazumder

Frederick Meisenkothen