A Novel Electrical Bias Technique to Recover Degraded ReRAM Arrays for Deep Learning

Nov 30, 2023
3:15pm - 3:30pm

Hynes, Level 3, Room 313

Nanbo Gong

Paul Solomon

Eric Vogel

Takashi Ando

Fabia Farlin Athena^1,2,Nanbo Gong²,Ramachandran Muralidhar²,Paul Solomon²,Eric Vogel¹,Vijay Narayanan²,Takashi Ando²

Georgia Institute of Technology¹,IBM T.J. Watson Research Center²

Simone Fabiano, Linkoping University

Paschalis Gkoupidenis, Max Planck Institute

Zeinab Jahed, University of California, San Diego

Francesca Santoro, Forschungszentrum Jülich/RWTH Aachen University

Bronze
Kepler Computing

Simone Fabiano

Francesca Santoro