November 26 - December 1, 2023
Boston, Massachusetts
Symposium Supporters
2023 MRS Fall Meeting
CH01.08.32

Nanoscale Fluctuation Analysis on Capacitance-Voltage Profiles of Semiconductors by Time-Resolved Scanning Nonlinear Dielectric Microscopy

When and Where

Nov 28, 2023
8:00pm - 10:00pm
Hynes, Level 1, Hall A

Presenter(s)

Co-Author(s)

Yasuo Cho1,Kohei Yamasue1

Tohoku University1

Keywords

scanning probe microscopy (SPM)

Symposium Organizers

Liam Collins, Oak Ridge National Laboratory
Rajiv Giridharagopal, University of Washington
Philippe Leclere, University of Mons
Thuc-Quyen Nguyen, University of California, Santa Barbara

Symposium Support

Silver
Bruker
Digital Surf

Session Chairs

Liam Collins
Rajiv Giridharagopal
Philippe Leclere

In this Session