Local Capacitance-Voltage Profiling of Al₂O₃/OH-Diamond (111) by Scanning Nonlinear Dielectric Microscopy

Nov 29, 2023
8:30am - 8:45am

Sheraton, Third Floor, Commonwealth

Yu Ogata

Norio Tokuda

Yasuo Cho

Yasuo Cho¹,Kohei Yamasue¹,Yu Ogata¹,Tsubasa Matsumoto²,Norio Tokuda²

Tohoku University¹,Kanazawa University²

diamond | scanning probe microscopy (SPM)

Liam Collins, Oak Ridge National Laboratory

Rajiv Giridharagopal, University of Washington

Philippe Leclere, University of Mons

Thuc-Quyen Nguyen, University of California, Santa Barbara

Silver
Bruker
Digital Surf

Rajiv Giridharagopal

John Marohn

Local Capacitance-Voltage Profiling of Al2O3/OH-Diamond (111) by Scanning Nonlinear Dielectric Microscopy