Measuring Chemical Composition, Optical and Thermal Properties at the Nanoscale with AFM Probes—Applications to Energy Materials.

Nov 29, 2023
1:45pm - 2:15pm

Sheraton, Third Floor, Commonwealth

Andrea Centrone¹

National Institute of Standards and Technology¹

chemical composition | perovskites | scanning probe microscopy (SPM)

Liam Collins, Oak Ridge National Laboratory

Rajiv Giridharagopal, University of Washington

Philippe Leclere, University of Mons

Thuc-Quyen Nguyen, University of California, Santa Barbara

Silver
Bruker
Digital Surf

Kimberley Callaghan

Philippe Leclere