Quantitative Comparison of Conductivity and Piezoresistance in Networks of Graphene Nanosheets with Different Aspect Ratios

Nov 27, 2023
8:00pm - 10:00pm

Hynes, Level 1, Hall A

Eoin Caffrey

Jose Munuera

Luke Doolan

Cian Gabbett

Oran Cassidy

Tian Carey

Adam Kelly

Eoin Caffrey¹,Jose Munuera¹,Luke Doolan¹,Kevin Synnatschke¹,Cian Gabbett¹,Oran Cassidy¹,Tian Carey¹,Joseph Neilson¹,Adam Kelly¹,Jonathan Coleman¹

Trinity College Dublin¹

2D materials | scanning electron microscopy (SEM)

Gabriela Borin Barin, Empa

Shengxi Huang, Rice University

Yuxuan Cosmi Lin, TSMC Technology Inc

Lain-Jong Li, The University of Hong Kong

Silver
Montana Instruments

Bronze
Oxford Instruments WITec
PicoQuant
Raith America, Inc.

Gabriela Borin Barin

Lain-Jong Li