Function and Electronic Structure of Defects in the SnO₂ Buffer Layer Between the α-Fe₂O₃ Water Oxidation Photoelectrode and the Transparent Conducting Oxide Current Collector

May 23, 2022
2:45pm - 3:00pm

EQ02-Virtual

Yelin Hu

Songhak Yoon

Artur Braun

Artur Braun¹,Yelin Hu^1,2,Florent Boudoire^1,3,Matthew Mayer²,Songhak Yoon¹,Michael Grätzel²

Empa¹,EPFL²,Universität Basel³

defects | electronic structure | thin film

Hua Zhou, Argonne National Laboratory

Carmela Aruta, National Research Council

Panchapakesan Ganesh, Oak Ridge National Laboratory

Yuanyuan Zhou, Hong Kong Baptist University

Silver
Journal of Energy Chemistry | Science China Press Co. Ltd

Carmela Aruta

Yuanyuan Zhou

Function and Electronic Structure of Defects in the SnO2 Buffer Layer Between the α-Fe2O3 Water Oxidation Photoelectrode and the Transparent Conducting Oxide Current Collector