May 8 - 13, 2022
Honolulu, Hawaii
May 23 - 25, 2022 (Virtual)
2022 MRS Spring Meeting
CH01.05.05
Imaging Dilute Atomic Impurities in a Monolayer Semiconductor by Conductive Atomic Force Microscopy
When and Where
May 10, 2022
5:00pm - 7:00pm
5:00pm - 7:00pm
Hawai'i Convention Center, Level 1, Kamehameha Exhibit Hall 2 & 3
Presenter(s)
Co-Author(s)
Nam Vu1,Goki Eda1,Yuan Chen1,Leyi Loh1,Takashi Taniguchi2,Kenji Watanabe2
National University of Singapore1,National Institute for Materials Science2
Keywords
2D materials | defects | scanning probe microscopy (SPM)
Symposium Organizers
Wenpei Gao, North Carolina State University
Arnaud Demortiere, Universite de Picardie Jules Verne
Madeline Dukes, Protochips, Inc.
Yuzi Liu, Argonne National Laboratory
Symposium Support
Silver
Protochips
Protochips
Session Chairs
Arnaud Demortiere
Madeline Dukes
Wenpei Gao
Yuzi Liu