May 8 - 13, 2022
Honolulu, Hawaii
May 23 - 25, 2022 (Virtual)
2022 MRS Spring Meeting
NM01.10.01
Picometer-Scale Characterization of Structure, Fields and Defects in 2D Materials Using 4D-STEM
When and Where
May 10, 2022
10:30am - 11:00am
10:30am - 11:00am
Hawai'i Convention Center, Level 3, 311
Presenter(s)
Co-Author(s)
Yu-Tsun Shao1,David Muller1
Cornell University1
Keywords
2D materials | scanning transmission electron microscopy (STEM) | transmission electron microscopy (TEM)
Symposium Organizers
Zakaria Al Balushi, University of California, Berkeley
Olga Kazakova, National Physical Laboratory
Su Ying Quek, National University of Singapore
Hyeon Jin Shin, Gwangju Institute of Science and Technology
Symposium Support
Bronze
Applied Physics Reviews | AIP Publishing
ATTOLIGHT AG
Penn State 2DCC-MIP
Applied Physics Reviews | AIP Publishing
ATTOLIGHT AG
Penn State 2DCC-MIP
Session Chairs
Zakaria Al Balushi
Sanjay Behura